| The effects of Zn ratio on the microstructure electrical properties of InGaZnO films H Jeon, S Na, MR Moon, D Jung, H Kim, HJ Lee Journal of The Electrochemical Society 158 (10), H949, 2011 | 30 | 2011 |
| A study on the microstructural and chemical evolution of In–Ga–Zn–O sol–gel films and the effects on the electrical properties H Jeon, J Song, S Na, M Moon, J Lim, J Joo, D Jung, H Kim, J Noh, ... Thin Solid Films 540, 31-35, 2013 | 27 | 2013 |
| Microstructure evolution of sputtered BiSb–Te thermoelectric films during post-annealing and its effects on the thermoelectric properties S Jeon, H Jeon, S Na, SD Kang, HK Lyeo, S Hyun, HJ Lee Journal of alloys and compounds 553, 343-349, 2013 | 27 | 2013 |
| Observation of Electrochemically Driven Elemental Segregation in a Si Alloy ThinFilm Anode and its Effects on Cyclic Stability for LiIon Batteries M Oh, S Na, CS Woo, JH Jeong, SS Kim, A Bachmatiuk, MH Rümmeli, ... Advanced Energy Materials 5 (22), 1501136, 2015 | 24 | 2015 |
| Effects of Sn doping on the growth morphology and electrical properties of ZnO nanowires S Kim, S Na, H Jeon, S Kim, B Lee, J Yang, H Kim, HJ Lee Nanotechnology 24 (6), 065703, 2013 | 21 | 2013 |
| Electromigration characteristics and morphological evolution of Cu interconnects on CVD Co and Ru liners for 10-nm class VLSI technology KT Jang, SY Lee, SK Na, SK Lee, JM Baek, WK You, OH Park, RH Kim, ... IEEE Electron Device Letters 39 (7), 1050-1053, 2018 | 18 | 2018 |
| Controlled Molybdenum Disulfide Assembly inside Carbon Nanofiber by Boudouard Reaction Inspired Selective Carbon Oxidation. DH Nam, HY Kang, JH Jo, BK Kim, S Na, U Sim, IK Ahn, KW Yi, KT Nam, ... Advanced Materials (Deerfield Beach, Fla.) 29 (12), 2017 | 17 | 2017 |
| Thermomechanical In Situ Monitoring of Bi2Te3 Thin Film and Its Relationship with Microstructure and Thermoelectric Performances MW Jeong, S Na, H Shin, HB Park, HJ Lee, YC Joo Electronic Materials Letters 14, 426-431, 2018 | 14 | 2018 |
| Improved battery performance of nanocrystalline Si anodes utilized by radio frequency (RF) sputtered multifunctional amorphous Si coating layers IK Ahn, YJ Lee, S Na, SY Lee, DH Nam, JH Lee, YC Joo ACS applied materials & interfaces 10 (3), 2242-2248, 2018 | 14 | 2018 |
| Effects of film thickness and deposition rate on the diffusion barrier performance of titanium nitride in Cu-through silicon vias YJ Lee, HW Yeon, SY Jung, SK Na, JS Park, YY Choi, HJ Lee, OS Song, ... Electronic Materials Letters 10, 275-279, 2014 | 14 | 2014 |
| Effects of substrate heating on the amorphous structure of InGaZnO films and the electrical properties of their thin film transistors MR Moon, S Na, H Jeon, CH An, K Park, D Jung, H Kim, YB Lee, HJ Lee Applied Physics Express 3 (11), 111101, 2010 | 13 | 2010 |
| New pathway for the formation of metallic cubic phase Ge-Sb-Te compounds induced by an electric current YJ Park, JY Cho, MW Jeong, S Na, YC Joo Scientific reports 6 (1), 21466, 2016 | 12 | 2016 |
| Cu DiffusionDriven Dynamic Modulation of the Electrical Properties of Amorphous Oxide Semiconductors HW Yeon, J Jo, H Song, Y Kang, S Na, H Yoo, SY Lee, H Cho, HY Kang, ... Advanced Functional Materials 27 (25), 1700336, 2017 | 11 | 2017 |
| Rapid and Reliable Formation of Highly Densified Bilayer Oxide Dielectrics on Silicon Substrates via DUV Photoactivation for Low-Voltage Solution-Processed Oxide Thin-Film … WJ Lee, JG Choi, S Sung, CH Kim, S Na, YC Joo, S Park, MH Yoon ACS Applied Materials & Interfaces 13 (2), 2820-2828, 2021 | 9 | 2021 |
| Study on the contact resistance of various metals (Au, Ti, and Sb) on Bi–Te and Sb–Te thermoelectric films H Yong, S Na, JG Gang, HS Shin, SJ Jeon, SM Hyun, HJ Lee Japanese Journal of Applied Physics 55 (6S3), 06JE03, 2016 | 9 | 2016 |
| Enhancement of electrical conductivity of silver nanowires-networked films via the addition of Cs-added TiO2 S Kim, H Lee, S Na, E Jung, J Kang, D Kim, SM Cho, H Chae, HK Chung, ... Nanotechnology 26 (13), 135705, 2015 | 9 | 2015 |
| Microstructure and electrical properties of XInZnO (X= Ti, Zr, Hf) films and device performance of their thin film transistors—The effects of employing Group IV-B elements in … MR Moon, H Jeon, S Na, S Kim, D Jung, H Kim, HJ Lee Journal of alloys and compounds 563, 124-129, 2013 | 9 | 2013 |
| Silicide formation process of Er films with Ta and TaN capping layers J Choi, S Choi, J Kim, S Na, HJ Lee, SH Lee, H Kim ACS Applied Materials & Interfaces 5 (23), 12744-12750, 2013 | 7 | 2013 |
| The effects of a combined thermal treatment of substrate heating and postannealing on the microstructure of InGaZnO films and the device performance of their thin film transistors MR Moon, S Na, H Jeon, TH Lee, D Jung, H Kim, JM Yang, HJ Lee Surface and interface analysis 44 (11-12), 1431-1435, 2012 | 7 | 2012 |
| Defect-free erbium silicide formation using an ultrathin Ni interlayer J Choi, S Choi, YS Kang, S Na, HJ Lee, MH Cho, H Kim ACS Applied Materials & Interfaces 6 (16), 14712-14717, 2014 | 4 | 2014 |
