Ibir: Bug report driven fault injection A Khanfir, A Koyuncu, M Papadakis, M Cordy, TF Bissyandé, J Klein, ... [TOSEM 2022] https://doi.org/10.1145/3542946 ACM Transactions on Software …, 2020 | 24 | 2020 |
Syntactic vs. semantic similarity of artificial and real faults in mutation testing studies M Ojdanic, A Garg, A Khanfir, R Degiovanni, M Papadakis, Y Le Traon IEEE Transactions on Software Engineering, 2023 | 13 | 2023 |
Efficient mutation testing via pre-trained language models A Khanfir, R Degiovanni, M Papadakis, YL Traon arXiv preprint arXiv:2301.03543, 2023 | 12* | 2023 |
CodeBERT-nt: code naturalness via CodeBERT A Khanfir, M Jimenez, M Papadakis, YL Traon 2022 IEEE 22nd International Conference on Software Quality, Reliability and …, 2022 | 9 | 2022 |
Confuzzion: A java virtual machine fuzzer for type confusion vulnerabilities W Bonnaventure, A Khanfir, A Bartel, M Papadakis, Y Le Traon 2021 IEEE 21st International Conference on Software Quality, Reliability and …, 2021 | 8 | 2021 |
Android malware detection using bert B Souani, A Khanfir, A Bartel, K Allix, Y Le Traon International Conference on Applied Cryptography and Network Security, 575-591, 2022 | 5 | 2022 |
On comparing mutation testing tools through learning-based mutant selection M Ojdanic, A Khanfir, A Garg, R Degiovanni, M Papadakis, Y Le Traon 2023 IEEE/ACM International Conference on Automation of Software Test (AST …, 2023 | 4 | 2023 |
Effective and scalable fault injection using bug reports and generative language models A Khanfir Proceedings of the 30th ACM Joint European Software Engineering Conference …, 2022 | 3 | 2022 |
IntJect: Vulnerability Intent Bug Seeding B Petit, A Khanfir, E Soremekun, G Perrouin, M Papadakis 2022 IEEE 22nd International Conference on Software Quality, Reliability and …, 2022 | 1 | 2022 |
TARGETED, REALISTIC AND NATURAL FAULT INJECTION:(USING BUG REPORTS AND GENERATIVE LANGUAGE MODELS) A Khanfir University of Luxembourg, Luxembourg, Luxembourg, 2023 | | 2023 |
2021 IEEE 21st International Conference on Software Quality, Reliability and Security (QRS)| 978-1-6654-5813-9/21/$31.00© 2021 IEEE| DOI: 10.1109/QRS54544. 2021.00119 D Afriyie, C Aguilera González, I Ahmed, OI Al-Bataineh, L Albors Zumel, ... | | |
QRS 2022 R Khoury, L Bo, X Meng, X Sun, J Xia, X Wu, B Petit, A Khanfir | | |