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Ahmed Khanfir
Ahmed Khanfir
Verified email at uni.lu
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Ibir: Bug report driven fault injection
A Khanfir, A Koyuncu, M Papadakis, M Cordy, TF Bissyandé, J Klein, ...
[TOSEM 2022] https://doi.org/10.1145/3542946 ACM Transactions on Software …, 2020
242020
Syntactic vs. semantic similarity of artificial and real faults in mutation testing studies
M Ojdanic, A Garg, A Khanfir, R Degiovanni, M Papadakis, Y Le Traon
IEEE Transactions on Software Engineering, 2023
132023
Efficient mutation testing via pre-trained language models
A Khanfir, R Degiovanni, M Papadakis, YL Traon
arXiv preprint arXiv:2301.03543, 2023
12*2023
CodeBERT-nt: code naturalness via CodeBERT
A Khanfir, M Jimenez, M Papadakis, YL Traon
2022 IEEE 22nd International Conference on Software Quality, Reliability and …, 2022
92022
Confuzzion: A java virtual machine fuzzer for type confusion vulnerabilities
W Bonnaventure, A Khanfir, A Bartel, M Papadakis, Y Le Traon
2021 IEEE 21st International Conference on Software Quality, Reliability and …, 2021
82021
Android malware detection using bert
B Souani, A Khanfir, A Bartel, K Allix, Y Le Traon
International Conference on Applied Cryptography and Network Security, 575-591, 2022
52022
On comparing mutation testing tools through learning-based mutant selection
M Ojdanic, A Khanfir, A Garg, R Degiovanni, M Papadakis, Y Le Traon
2023 IEEE/ACM International Conference on Automation of Software Test (AST …, 2023
42023
Effective and scalable fault injection using bug reports and generative language models
A Khanfir
Proceedings of the 30th ACM Joint European Software Engineering Conference …, 2022
32022
IntJect: Vulnerability Intent Bug Seeding
B Petit, A Khanfir, E Soremekun, G Perrouin, M Papadakis
2022 IEEE 22nd International Conference on Software Quality, Reliability and …, 2022
12022
TARGETED, REALISTIC AND NATURAL FAULT INJECTION:(USING BUG REPORTS AND GENERATIVE LANGUAGE MODELS)
A Khanfir
University of Luxembourg,​ Luxembourg,​​ Luxembourg, 2023
2023
2021 IEEE 21st International Conference on Software Quality, Reliability and Security (QRS)| 978-1-6654-5813-9/21/$31.00© 2021 IEEE| DOI: 10.1109/QRS54544. 2021.00119
D Afriyie, C Aguilera González, I Ahmed, OI Al-Bataineh, L Albors Zumel, ...
QRS 2022
R Khoury, L Bo, X Meng, X Sun, J Xia, X Wu, B Petit, A Khanfir
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