| Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation K Lee, S Nam, H Ji, J Choi, JE Jin, Y Kim, J Na, MY Ryu, YH Cho, H Lee, ... npj 2D Materials and Applications 5 (1), 4, 2021 | 8 | 2021 |
| Detection and accurate classification of mixed gases using machine learning with impedance data K Lee, S Nam, H Kim, DY Jeon, D Shin, HG Lim, C Kim, D Kim, Y Kim, ... Advanced Theory and Simulations 3 (7), 2000012, 2020 | 8 | 2020 |
