| System-level modeling of microprocessor reliability degradation due to BTI and HCI CC Chen, S Cha, T Liu, L Milor 2014 IEEE International Reliability Physics Symposium, CA. 8.1-CA. 8.9, 2014 | 34 | 2014 |
| SRAM stability analysis for different cache configurations due to bias temperature instability and hot carrier injection T Liu, CC Chen, J Wu, L Milor 2016 IEEE 34th International Conference on Computer Design (ICCD), 225-232, 2016 | 30 | 2016 |
| System-level modeling and microprocessor reliability analysis for backend wearout mechanisms CC Chen, L Milor 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2013 | 28 | 2013 |
| System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown T Liu, CC Chen, S Cha, L Milor Microelectronics Reliability 55 (9-10), 1334-1340, 2015 | 26 | 2015 |
| Microprocessor aging analysis and reliability modeling due to back-end wearout mechanisms CC Chen, L Milor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (10 …, 2014 | 24 | 2014 |
| Comprehensive reliability-aware statistical timing analysis using a unified gate-delay model for microprocessors T Liu, CC Chen, L Milor IEEE Transactions on Emerging Topics in Computing 6 (2), 219-232, 2016 | 23 | 2016 |
| System-level modeling of microprocessor reliability degradation due to bias temperature instability and hot carrier injection CC Chen, T Liu, L Milor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (8 …, 2016 | 22 | 2016 |
| Comprehensive reliability and aging analysis on SRAMs within microprocessor systems T Liu, CC Chen, W Kim, L Milor Microelectronics Reliability 55 (9-10), 1290-1296, 2015 | 19 | 2015 |
| Accurate standard cell characterization and statistical timing analysis using multivariate adaptive regression splines T Liu, CC Chen, L Milor Sixteenth International Symposium on Quality Electronic Design, 272-279, 2015 | 18 | 2015 |
| Extraction of threshold voltage degradation modeling due to negative bias temperature instability in circuits with I/O measurements S Cha, CC Chen, T Liu, LS Milor 2014 IEEE 32nd VLSI Test Symposium (VTS), 1-6, 2014 | 18 | 2014 |
| System-level modeling and reliability analysis of microprocessor systems CC Chen, L Milor 5th IEEE International Workshop on Advances in Sensors and Interfaces IWASI …, 2013 | 16 | 2013 |
| Backend dielectric chip reliability simulator for complex interconnect geometries CC Chen, M Bashir, L Milor, DH Kim, SK Lim 2012 IEEE International Reliability Physics Symposium (IRPS), BD. 4.1-BD. 4.8, 2012 | 14 | 2012 |
| Built-in self-test methodology with statistical analysis for electrical diagnosis of wearout in a static random access memory array W Kim, CC Chen, DH Kim, L Milor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (7 …, 2016 | 13 | 2016 |
| Processor-level reliability simulator for time-dependent gate dielectric breakdown CC Chen, T Liu, S Cha, L Milor Microprocessors and Microsystems 39 (8), 950-960, 2015 | 11 | 2015 |
| Impact of NBTI/PBTIon SRAMs within microprocessor systems: Modeling, simulation, and analysis CC Chen, F Ahmed, L Milor Microelectronics Reliability 53 (9-11), 1183-1188, 2013 | 11 | 2013 |
| Memory and logic lifetime simulation systems and methods L Milor, T Liu, CC Chen US Patent 10,514,973, 2019 | 10 | 2019 |
| System-level estimation of threshold voltage degradation due to NBTI with I/O measurements S Cha, CC Chen, LS Milor 2014 IEEE International Reliability Physics Symposium, PR. 1.1-PR. 1.7, 2014 | 10 | 2014 |
| A comparative study of wearout mechanisms in state-of-art microprocessors CC Chen, F Ahmed, L Milor 2012 IEEE 30th International Conference on Computer Design (ICCD), 271-276, 2012 | 10 | 2012 |
| SRAM stability analysis and performance–reliability tradeoff for different cache configurations R Zhang, T Liu, K Yang, CC Chen, L Milor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 28 (3), 620-633, 2020 | 8 | 2020 |
| Backend dielectric reliability full chip simulator MM Bashir, CC Chen, L Milor, DH Kim, SK Lim IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (8 …, 2013 | 8 | 2013 |
