Chang-Chih Chen
Chang-Chih Chen
在 oracle.com 的电子邮件经过验证
标题
引用次数
引用次数
年份
System-level modeling of microprocessor reliability degradation due to BTI and HCI
CC Chen, S Cha, T Liu, L Milor
2014 IEEE International Reliability Physics Symposium, CA. 8.1-CA. 8.9, 2014
282014
System-level modeling and microprocessor reliability analysis for backend wearout mechanisms
CC Chen, L Milor
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2013
272013
SRAM stability analysis for different cache configurations due to Bias Temperature Instability and Hot Carrier Injection
T Liu, CC Chen, J Wu, L Milor
2016 IEEE 34th International Conference on Computer Design (ICCD), 225-232, 2016
252016
System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown
T Liu, CC Chen, S Cha, L Milor
Microelectronics Reliability 55 (9-10), 1334-1340, 2015
222015
Comprehensive reliability-aware statistical timing analysis using a unified gate-delay model for microprocessors
T Liu, CC Chen, L Milor
IEEE Transactions on Emerging Topics in Computing 6 (2), 219-232, 2016
192016
Microprocessor aging analysis and reliability modeling due to back-end wearout mechanisms
CC Chen, L Milor
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (10 …, 2014
182014
System-level modeling and reliability analysis of microprocessor systems
CC Chen, L Milor
5th IEEE International Workshop on Advances in Sensors and Interfaces IWASI …, 2013
182013
Comprehensive reliability and aging analysis on SRAMs within microprocessor systems
T Liu, CC Chen, W Kim, L Milor
Microelectronics Reliability 55 (9-10), 1290-1296, 2015
172015
Extraction of threshold voltage degradation modeling due to negative bias temperature instability in circuits with I/O measurements
S Cha, CC Chen, T Liu, LS Milor
2014 IEEE 32nd VLSI Test Symposium (VTS), 1-6, 2014
172014
Backend dielectric chip reliability simulator for complex interconnect geometries
CC Chen, M Bashir, L Milor, DH Kim, SK Lim
2012 IEEE International Reliability Physics Symposium (IRPS), BD. 4.1-BD. 4.8, 2012
172012
System-level modeling of microprocessor reliability degradation due to bias temperature instability and hot carrier injection
CC Chen, T Liu, L Milor
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (8 …, 2016
142016
Impact of NBTI/PBTIon SRAMs within microprocessor systems: Modeling, simulation, and analysis
CC Chen, F Ahmed, L Milor
Microelectronics Reliability 53 (9-11), 1183-1188, 2013
142013
A comparative study of wearout mechanisms in state-of-art microprocessors
CC Chen, F Ahmed, L Milor
2012 IEEE 30th International Conference on Computer Design (ICCD), 271-276, 2012
142012
Accurate standard cell characterization and statistical timing analysis using multivariate adaptive regression splines
T Liu, CC Chen, L Milor
Sixteenth International Symposium on Quality Electronic Design, 272-279, 2015
132015
System-level estimation of threshold voltage degradation due to NBTI with I/O measurements
S Cha, CC Chen, LS Milor
2014 IEEE International Reliability Physics Symposium, PR. 1.1-PR. 1.7, 2014
112014
Backend dielectric reliability full chip simulator
MM Bashir, CC Chen, L Milor, DH Kim, SK Lim
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (8 …, 2013
102013
Built-in self-test methodology with statistical analysis for electrical diagnosis of wearout in a static random access memory array
W Kim, CC Chen, DH Kim, L Milor
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (7 …, 2016
92016
Processor-level reliability simulator for time-dependent gate dielectric breakdown
CC Chen, T Liu, S Cha, L Milor
Microprocessors and Microsystems 39 (8), 950-960, 2015
92015
Estimation of remaining life using embedded SRAM for wearout parameter extraction
W Kim, CC Chen, T Liu, S Cha, L Milor
2015 6th International Workshop on Advances in Sensors and Interfaces (IWASI …, 2015
72015
Frontend wearout modeling from device to system with power/ground signature analysis
S Cha, CC Chen, LS Milor
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW …, 2014
72014
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