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S.V.Khokale
S.V.Khokale
Principal Electrical Engineer at Skyworks
Verified email at skyworksinc.com - Homepage
Title
Cited by
Cited by
Year
SiGe HBTs with Integrated in 45nm PDSOI CMOS
J Pekarik, V Jain, C Kenney, J Holt, S Khokale, S Saroop, JB Johnson, ...
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2021
102021
FinFET with contact over active-gate for 5G ultra-wideband applications
A Razavieh, V Mahajan, WL Oo, S Cimino, SV Khokale, K Nagahiro, ...
2020 IEEE Symposium on VLSI Technology, 1-2, 2020
102020
Utilizing single scan and enhanced design-based binning methodologies for improved process window and hotspot discovery
S Singh, S Khokale, Q Xie, P Venkatachalam, A Greer, A Mathur, A Jain
2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2019
52019
415/610GHz fT/fMAX SiGe HBTs Integrated in a 45nm PDSOI BiCMOS process
V Jain, J Pekarik, C Kenney, J Holt, C Durcan, JB Johnson, S Saroop, ...
2022 International Electron Devices Meeting (IEDM), 11.6. 1-11.6. 4, 2022
42022
LNFET device with 325/475GHz and 0.47dB NFMIN at 20GHz for SATCOM applications in 45nm PDSOI CMOS
SV Khokale, T Ethirajan, HK Kakara, B Humphrey, K Shanbhag, ...
2022 IEEE Radio Frequency Integrated Circuits Symposium (RFIC), 275-278, 2022
32022
Stacked field-effect transistors with a shielded output
SV Khokale, K Shanbhag, T Ethirajan
US Patent 11,721,621, 2023
2023
Challenges for Sige Bicmos in Advanced-Node SOI
J Pekarik, V Jain, C Kenney, J Holt, S Khokale, S Saroop, J Johnson, ...
ECS Transactions 109 (4), 141, 2022
2022
Aerial image ORC checks and their correlation to wafer-edge yield limitation for metals: a study and an OPC resolution
T Desouky, S Khokale, Y Zhang, M Terry, H Yin, M Pallachali, N Petrov, ...
Photomask Technology 10451, 104511L, 2017
2017
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