| Ultra-high total ionizing dose effects on MOSFETs for analog applications H Dewitte, P Paillet, S Rizzolo, A Le Roch, C Marcandella, V Goiffon IEEE Transactions on Nuclear Science 68 (5), 697-706, 2021 | 16 | 2021 |
| Phosphorus versus arsenic: Role of the photodiode doping element in cmos image sensor radiation-induced dark current and random telegraph signal A Le Roch, C Virmontois, P Paillet, JM Belloir, S Rizzolo, O Marcelot, ... IEEE Transactions on Nuclear Science 67 (7), 1241-1250, 2020 | 8 | 2020 |
| Radiation-induced junction-leakage random-telegraph-signal H Dewitte, V Goiffon, A Le Roch, S Rizzolo, C Virmontois, C Marcandella, ... IEEE Transactions on Nuclear Science 69 (3), 290-298, 2021 | 6 | 2021 |
| Probing dark current random telegraph signal in a small pitch vertically pinned photodiode CMOS image sensor after proton irradiation A Antonsanti, C Virmontois, JM Lauenstein, A Le Roch, H Dewitte, ... IEEE Transactions on Nuclear Science 69 (7), 1506-1514, 2022 | 5 | 2022 |
| Implementation of an FPGA based calibration procedure at the detector level for the future high-luminosity phase of the CMS H Dewitte Brussels U., 2016 | 3 | 2016 |
| Annealing effects on radiation-hardened CMOS image sensors exposed to ultrahigh total ionizing doses H Dewitte, S Rizzolo, P Paillet, P Magnan, A Le Roch, F Corbière, ... IEEE Transactions on Nuclear Science 67 (7), 1284-1292, 2020 | 2 | 2020 |
| Junction Leakage Random Telegraph Signals in Arrays of MOSFETs H Dewitte, V Goiffon, A Le Roch, S Rizzolo, A Jay, M Jech, A Hémeryck, ... IEEE Electron Device Letters 42 (11), 1650-1653, 2021 | 1 | 2021 |
| List of Reviewers RADECS 2021 Special Issue S Agarwal, A Alessi, RG Alia, J Anderson, L Artola, Z Baker, D Ball, ... IEEE Transactions on Nuclear Science 69 (7), 2022 | | 2022 |
| Effets des Hautes Doses de radiation et étude des fuites de jonction dans les technologies CMOS pour applications analogiques H Dewitte | | 2022 |
| Ultra-high dose effects and junction leakage current in CMOS technologies for analog applications H Dewitte Toulouse, ISAE, 2022 | | 2022 |
| Hours-Long Transient Leakage Current in MOS Structures Induced by High Total-Ionizing-Dose H Dewitte, P Paillet, A Le Roch, S Rizzolo, C Marcandella, V Goiffon IEEE Transactions on Nuclear Science 69 (7), 1428-1436, 2022 | | 2022 |
| List of Reviewers, RADECS 2020 Special Issue A Alessi, S Baeg, M Bagatin, D Ball, M Barbero, M Beaumel, J Bi, ... IEEE Transactions on Nuclear Science 68 (8), 2021 | | 2021 |
| NSREC 2020 Special Issue of the IEEE Transactions on Nuclear Science M Bagatin, W Bailey, D Ball, A Barnard, M Beaumel, ... IEEE Transactions on Nuclear Science 68 (5), 493, 2021 | | 2021 |
