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Etienne MONIER
Etienne MONIER
IRIT / INPT-ENSEEIHT / Université de Toulouse
Verified email at irit.fr - Homepage
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Cited by
Year
Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling
E Monier, T Oberlin, N Brun, X Li, M Tencé, N Dobigeon
Ultramicroscopy 215, 112993, 2020
202020
Reconstruction of partially sampled multiband images—application to STEM-EELS imaging
E Monier, T Oberlin, N Brun, M Tencé, M de Frutos, N Dobigeon
IEEE Transactions on Computational Imaging 4 (4), 585-598, 2018
162018
Cramér-Rao bounds for the localization of anisotropic sources
E Monier, G Chardon
2017 IEEE International Conference on Acoustics, Speech and Signal …, 2017
42017
Reconstruction of partially sampled EELS images
E Monier, T Oberlin, N Brun, M Tencé, M de Frutos, N Dobigeon
2018 9th Workshop on Hyperspectral Image and Signal Processing: Evolution in …, 2018
32018
Reconstruction rapide d'images multi-bandes partiellement échantillonnées en spectromicroscopie EELS
E Monier
Institut National Polytechnique de Toulouse-INPT, 2020
12020
Reconstruction of partially sampled STEM-EELS images with atomic resolution
E Monier, T Oberlin, N Brun, N Dobigeon
Workshop on Signal Processing with Adaptative Sparse Structured …, 2019
12019
Reconstruction de spectres-images STEM-EELS partiellement échantillonnés
E Monier, T Oberlin, N Brun, M Tencé, M De Frutos, N Dobigeon
16e Colloque de la Société Française des Microscopies (SFU 2019), 74-75, 2019
2019
Reconstruction de spectres-images partiellement échantillonnés en microscopie EELS
E Monier, T Oberlin, N Brun, N Dobigeon
26eme Colloque GRETSI sur le Traitement du Signal et des Images (GRETSI 2017 …, 2017
2017
Reconstruction of randomly and partially sampled STEM spectrum-images
E Monier, T Oberlin, N Brun, M Tencé, N Dobigeon
Microscopy and Microanalysis 23 (S1), 170-171, 2017
2017
A Partial Random Sampling STEM Procedure For Sensitive Samples
E Monier, T Oberlin, N Brun, M Tencé, M de Frutos, N Dobigeon
Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling–Supplementary materials
E Monier, T Oberlin, N Brun, X Li, M Tencé, N Dobigeon
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Articles 1–11