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Co-authors
- Chul-Joon HeoSAIT, Samsung ElectronicsVerified email at samsung.com
- Stephen H. FoulgerGregg-Graniteville Endowed Chair and Professor at Clemson UniversityVerified email at clemson.edu
- Eunjoo JangSungkyunkwan UniversityVerified email at skku.edu
- Kyung-Bae ParkSamsung Advanced Institute of Technology, Research MasterVerified email at samsung.com
- Hong-Seok LeeAssociate Professor of Electrical Engineering, Pukyong National UniversityVerified email at pknu.ac.kr
- Seog-Jin JeonKumoh National Institute of TechnologyVerified email at kumoh.ac.kr
- Stephen CreagerClemson UniversityVerified email at clemson.edu
- Namkyoo ParkProfessor, Seoul National University, Department of Electrical and Computer EngineeringVerified email at snu.ac.kr
- Sam T. IngramClemson UniversityVerified email at clemson.edu
- Steven P. ArmesProfessor, University of SheffieldVerified email at sheffield.ac.uk
- Sanghoon KimUSDA-ARS-NCAURVerified email at USDA.GOV
- Grigor B. BantchevResearch Physical Scientist, USDA-ARS-NCAURVerified email at USDA.gov
- Jim KenarUnited states Department of AgricultureVerified email at usda.gov
- Joohyun LimKangwon National UniversityVerified email at kangwon.ac.kr
- Wonsik YoonPh.D, Samsung Advanced Institute of TechnologyVerified email at samsung.com
- Yu-Ho WonSamsung Advanced Institute of TechnologyVerified email at samsung.com
- Martin HeeneyKAUST, Imperial College LondonVerified email at imperial.ac.uk
- yang hanVerified email at uni.coventry.ac.uk
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Moon Gyu Han
Principal Research Scientist, Samsung Advanced Institute of Technology, Samsung Electronics
Verified email at samsung.com