Follow
Martin Jacob
Martin Jacob
Université Grenoble Alpes, CEA-LETI
Verified email at uca.fr
Title
Cited by
Cited by
Year
Impact of pore anisotropy on the thermal conductivity of porous Si nanowires
P Ferrando-Villalba, L D’Ortenzi, GG Dalkiranis, E Cara, AF Lopeandia, ...
Scientific reports 8 (1), 12796, 2018
232018
Correlative STEM-HAADF and STEM-EDX tomography for the 3D morphological and chemical analysis of semiconductor devices
M Jacob, J Sorel, RB Pinhiero, F Mazen, A Grenier, T Epicier, Z Saghi
Semiconductor Science and Technology 36 (3), 035006, 2021
92021
Studying phase change memory devices by coupling scanning precession electron diffraction and energy dispersive X-ray analysis
L Henry, N Bernier, M Jacob, G Navarro, L Clément, JL Rouvière, E Robin
Acta Materialia 201, 72-78, 2020
72020
Supported porous nanostructures developed by plasma processing of metal phthalocyanines and porphyrins
JM Obrero, AN Filippin, M Alcaire, JR Sanchez-Valencia, M Jacob, ...
Frontiers in Chemistry 8, 520, 2020
62020
Gradient-based and wavelet-based compressed sensing approaches for highly undersampled tomographic datasets
M Jacob, L El Gueddari, G Navarro, A Jannaud, G Mula, ...
Ultramicroscopy 225, 113289, 2021
42021
Statistical Machine Learning and Compressed Sensing Approaches for Analytical Electron Tomography-Application to Phase Change Materials
M Jacob, L El Gueddari, G Navarro, MC Cyrille, P Bayle-Guillemaud, ...
Microscopy and Microanalysis 25 (S2), 156-157, 2019
42019
Multivariate analysis and compressed sensing methods for spectroscopic electron tomography of semiconductor devices
M Jacob, T Sanders, N Bernier, A Grenier, RB Pinheiro, F Mazen, ...
Microscopy and Microanalysis 24 (S1), 500-501, 2018
42018
Correlative HAADF-STEM and EDX-STEM Tomography for the 3D Morphological and Elemental Analysis of FinFET Semiconductor Devices
J Sorel, M Jacob, T Sanders, A Grenier, RB Pinheiro, F Mazen, T Epicier, ...
Microscopy and Microanalysis 24 (S1), 388-389, 2018
22018
Recent advances in electron tomography and applications in the semiconductor Industry
Z Saghi, G Biagi, M Jacob, P Ciuciu
FCMN 2022-International Conference on Frontiers of Characterization and …, 2022
2022
Approches parcimonieuses appliquées à la tomographie électronique analytique
M Jacob
Université Grenoble Alpes [2020-....], 2021
2021
Supported Porous Nanostructures Developed by Plasma Processing of Metal Phthalocyanines and Porphyrins
JM Obrero Pérez, AN Filippin, M Alcaire Martín, JR Sánchez Valencia, ...
Frontiers in Chemistry, 8, 520., 2020
2020
The system can't perform the operation now. Try again later.
Articles 1–11