| Lifetime prediction of a polymer electrolyte membrane fuel cell via an accelerated startup–shutdown cycle test SJ Bae, SJ Kim, JI Park, CW Park, JH Lee, I Song, N Lee, KB Kim, JY Park international journal of hydrogen energy 37 (12), 9775-9781, 2012 | 79 | 2012 |
| Degradation pattern prediction of a polymer electrolyte membrane fuel cell stack with series reliability structure via durability data of single cells SJ Bae, SJ Kim, JH Lee, I Song, NI Kim, Y Seo, KB Kim, N Lee, JY Park Applied energy 131, 48-55, 2014 | 63 | 2014 |
| Lifetime prediction through accelerated degradation testing of membrane electrode assemblies in direct methanol fuel cells SJ Bae, SJ Kim, JI Park, JH Lee, H Cho, JY Park International Journal of Hydrogen Energy 35 (17), 9166-9176, 2010 | 50 | 2010 |
| Degradation analysis of nano-contamination in plasma display panels SJ Bae, SJ Kim, MS Kim, BJ Lee, CW Kang IEEE Transactions on Reliability 57 (2), 222-229, 2008 | 46 | 2008 |
| Statistical models for hot electron degradation in nano-scaled MOSFET devices SJ Bae, SJ Kim, W Kuo, PH Kvam IEEE Transactions on Reliability 56 (3), 392-400, 2007 | 30 | 2007 |
| A prediction model of degradation rate for membrane electrode assemblies in direct methanol fuel cells SJ Bae, SJ Kim, S Um, JY Park, JH Lee, H Cho international journal of hydrogen energy 34 (14), 5749-5758, 2009 | 29 | 2009 |
| Bayesian degradation modeling for reliability prediction of organic light-emitting diodes SJ Bae, T Yuan, S Kim Journal of Computational Science 17, 117-125, 2016 | 23 | 2016 |
| Cost-effective degradation test plan for a nonlinear random-coefficients model SJ Kim, SJ Bae Reliability Engineering & System Safety 110, 68-79, 2013 | 23 | 2013 |
| A cost-driven reliability demonstration plan based on accelerated degradation tests SJ Kim, BM Mun, SJ Bae Reliability Engineering & System Safety 183, 226-239, 2019 | 16 | 2019 |
| Optimal replacement strategy for stochastic deteriorating system with random wear limit under periodic inspections BJ Lee, CW Kang, SJ Kim, SJ Bae The International Journal of Advanced Manufacturing Technology 71, 219-231, 2014 | 12 | 2014 |
| Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects SJ Kim, MS Kim, SJ Bae IEEE ACCESS 7, 143160 - 143168, 2019 | 5 | 2019 |
| A spatio-temporal defect process model for competing progressive breakdown modes of ultra-thin gate oxides SJ Kim, T Yuan, SJ Bae IEEE Transactions on Reliability 65 (1), 263-271, 2015 | 5 | 2015 |
| High visibility or quiet operation?: A statistical inference model of the wiper operation quality by the dual-code theory S Kim, J Kim, SJ Bae, H Kang, D Kim, H Ryu International Journal of Industrial Ergonomics 44 (4), 482-492, 2014 | 2 | 2014 |
