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Co-authors
- Jonathan C. Mayo-MaldonadoThe University Of SheffieldVerified email at sheffield.ac.uk
- Jesus E. Valdez-ResendizTecnológico de MonterreyVerified email at tec.mx
- Antonio Valderrabano-GonzalezUniversidad PanamericanaVerified email at up.edu.mx
- Juan M RamirezCINVESTAV del IPNVerified email at cinvestav.mx
- Francisco Beltran-CarbajalUniversidad Autonoma MetropolitanaVerified email at azc.uam.mx
- Gerardo EscobarTecnologico de MonterreyVerified email at tec.mx
- Pedro Martin Garcia-ViteInstituto Tecnológico de Cd. MaderoVerified email at itcm.edu.mx
- Omar Fernando Ruiz MartínezUniversidad Panamericana Campus AguascalientesVerified email at up.edu.mx
- Victor SanchezUniversidad de Quintana RooVerified email at uqroo.edu.mx
- Fernando Mancilla-DavidProfessor, Electrical Engineering, University of Colorado DenverVerified email at ucdenver.edu
- Ruben Tapia OlveraFI-UNAM Department of Electrical EngineeringVerified email at fi-b.unam.mx
- Avelina Alejo-ReyesUniversidad PanamericanaVerified email at up.edu.mx
- Fang Z. PengFlorida State UniversityVerified email at fsu.edu
- ALMA NAYELI RODRIGUEZ VAZQUEZProfesor, Universidad de GuadalajaraVerified email at academicos.udg.mx
- J. Miguel GonzalezUniversidad Tecnológica de Manzanillo y Universidad de ColimaVerified email at ucol.mx
- Carolina Del-Valle-SotoUniversidad PanamericanaVerified email at up.edu.mx
- Carlos A. Soriano-RangelFunctional Safety Systems EngineerVerified email at marelli.com
- Daniel GuillenTecnologico de MonterreyVerified email at tec.mx
- Erik CuevasUniversidad de GuadalajaraVerified email at cucei.udg.mx
- Jesus De Leon MoralesUniversidad Autonoma de Nuevo Leon-FIME, UANLVerified email at uanl.edu.mx