| X-ray topography characterization of gallium nitride substrates for power device development B Raghothamachar, Y Liu, H Peng, T Ailihumaer, M Dudley, ... Journal of Crystal Growth 544, 125709, 2020 | 28 | 2020 |
| Synchrotron X-ray topography characterization of high quality ammonothermal-grown gallium nitride substrates Y Liu, B Raghothamachar, H Peng, T Ailihumaer, M Dudley, R Collazo, ... Journal of Crystal Growth 551, 125903, 2020 | 20 | 2020 |
| The improvement of Mo/4H-SiC Schottky diodes via a P2O5 surface passivation treatment AB Renz, VA Shah, OJ Vavasour, Y Bonyadi, F Li, T Dai, GWC Baker, ... Journal of Applied Physics 127 (2), 2020 | 16 | 2020 |
| Dislocation contrast on X-ray topographs under weak diffraction conditions H Peng, T Ailihumaer, Y Liu, B Raghotharmachar, X Huang, L Assoufid, ... Journal of Applied Crystallography 54 (4), 1225-1233, 2021 | 13 | 2021 |
| Characterization of prismatic slip in PVT-grown AlN crystals S Hu, H Fang, Y Liu, H Peng, Q Cheng, Z Chen, R Dalmau, J Britt, ... Journal of Crystal Growth 584, 126548, 2022 | 8 | 2022 |
| Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed by Various Profiles and Temperatures SA Mancini, SY Jang, Z Chen, D Kim, J Lynch, Y Liu, B Raghothamachar, ... 2022 IEEE International Reliability Physics Symposium (IRPS), P62-1-P62-6, 2022 | 7 | 2022 |
| Synchrotron X-ray topography studies of dislocation behavior during early stages of PVT growth of 4H-SiC crystals T Ailihumaer, H Peng, Y Liu, B Raghothamachar, M Dudley, G Chung, ... Journal of Electronic Materials 50, 3258-3265, 2021 | 6 | 2021 |
| Analysis of dislocation contrast in synchrotron grazing-incidence x-ray topographs and ray-tracing simulation in off-axis 4h-sic crystals T Ailihumaer, H Peng, Y Liu, Q Cheng, Z Chen, S Hu, B Raghothamachar, ... ECS Transactions 104 (7), 157, 2021 | 5 | 2021 |
| Characterization of 4H-SiC lattice damage after novel high energy ion implantation Z Chen, Y Liu, H Peng, T Ailihumaer, Q Cheng, S Hu, B Raghothamachar, ... ECS Transactions 104 (7), 75, 2021 | 5 | 2021 |
| Quantitative analysis of dislocations in 4H-SiC wafers using synchrotron X-ray topography with ultra-high angular resolution H Peng, Z Chen, Y Liu, B Raghothamachar, X Huang, L Assoufid, ... Journal of Applied Crystallography 55 (3), 544-550, 2022 | 4 | 2022 |
| Strain mapping of GaN substrates and epitaxial layers used for power electronic devices by synchrotron X-ray rocking curve topography Y Liu, Z Chen, S Hu, H Peng, Q Cheng, B Raghothamachar, M Dudley Journal of Crystal Growth 583, 126559, 2022 | 4 | 2022 |
| Microstructure analysis of GaN epitaxial layers during ion implantation using synchrotron X-ray topography Y Liu, H Peng, Z Chen, T Ailihumaer, Q Cheng, S Hu, B Raghothamachar, ... ECS Transactions 104 (7), 113, 2021 | 4 | 2021 |
| Characterization and Reduction of Defects in 4H-SiC Substrate and Homo-Epitaxial Wafer L Yang, LX Zhao, HW Wu, Y Liu, T Ailihumaer, B Raghothamachar, ... Materials Science Forum 1004, 387-392, 2020 | 4 | 2020 |
| Characterization of Dislocations in 6H-SiC Wafer Through X-Ray Topography and Ray-Tracing Simulations Q Cheng, T Ailihumaer, Y Liu, H Peng, Z Chen, B Raghothamachar, ... Journal of Electronic Materials 50 (7), 4104-4117, 2021 | 3 | 2021 |
| X-ray topography characterization of GaN substrates used for power electronic devices Y Liu, H Peng, T Ailihumaer, B Raghothamachar, M Dudley Journal of Electronic Materials 50, 2981-2989, 2021 | 3 | 2021 |
| Synchrotron X-ray Topography Characterization of Commercial GaN Substrates for Power Electronic Applications Y Liu, S Hu, H Peng, T Ailihumaer, B Raghothamachar, M Dudley ECS Transactions 98 (6), 21, 2020 | 3 | 2020 |
| Analysis of Basal Plane Dislocation Motion Induced by P+ Ion Implantation Using Synchrotron X-ray Topography ZY Chen, Y Liu, HY Peng, QY Cheng, SS Hu, B Raghothamachar, ... Defect and Diffusion Forum 426, 71-78, 2023 | 2 | 2023 |
| Investigation of Lattice Strain in High Energy Implanted 4H-SiC Wafers by Al or N Atoms ZY Chen, HY Peng, Y Liu, QY Cheng, SS Hu, B Raghothamachar, ... Materials Science Forum 1062, 361-365, 2022 | 2 | 2022 |
| Ray-Tracing Simulation Analysis of Effective Penetration Depths on Grazing Incidence Synchrotron X-Ray Topographic Images of Basal Plane Dislocations in 4H-SiC Wafers QY Cheng, HY Peng, SS Hu, ZY Chen, Y Liu, B Raghothamachar, ... Materials Science Forum 1062, 366-370, 2022 | 2 | 2022 |
| Effect of Annealing Conditions on Recovery of Lattice Damage in a High-Energy-Implanted 4H-SiC Superjunction PIN Diode Z Chen, Y Liu, H Peng, Q Cheng, S Hu, B Raghothamachar, M Dudley, ... ECS Journal of Solid State Science and Technology 11 (6), 065003, 2022 | 2 | 2022 |
Michael DudleyStony Brook Univ., Univ. of Warwick, Strathclyde Univ., Université Pierre et Marie Curie (Paris 6)Verified email at stonybrook.edu
