| Life cycle trends of electronic materials, processes and components CM Huang, JA Romero, M Osterman, D Das, M Pecht Microelectronics Reliability 99, 262-276, 2019 | 25 | 2019 |
| Reliability analysis of multilayer polymer aluminum electrolytic capacitors J Romero, MH Azarian, M Pecht Microelectronics Reliability 112, 113725, 2020 | 9 | 2020 |
| Life model for tantalum electrolytic capacitors with conductive polymers JA Romero, MH Azarian, M Pecht Microelectronics Reliability 104, 113550, 2020 | 9 | 2020 |
| Effects of moisture and temperature on membrane switches in laptop keyboards J Romero, MH Azarian, C Morillo, M Pecht IEEE Transactions on Device and Materials Reliability 18 (4), 535-545, 2018 | 5 | 2018 |
