| Empirical expressions for the spectral dependence of the refractive index for the case of thin-film silicon and some of its common alloys S Moghaddam, S K. O'Leary Journal of Materials Science: Materials in Electronics, 2018 | 6 | 2018 |
| A Sellmeier extended empirical model for the spectral dependence of the refractive index applied to the case of thin-film silicon and some of its more common alloys S Moghaddam, SK O’Leary Journal of Materials Science: Materials in Electronics 31, 212-225, 2020 | 5 | 2020 |
| Influence of the growth temperature on the spectral dependence of the optical functions associated with thin silicon films grown by ultra-high-vacuum evaporation on optical … SOL Saeed Moghaddam, Farida Orapunt, Mario Noël, Joanne C. Zwinkels, Jean ... Journal of Materials Science: Materials in Electronics, 2020 | 4 | 2020 |
| Noise measurement in microsensor applications S Moghaddam Simon Fraser University, School of Mechatronic Systems Engineering, 2016 | 4 | 2016 |
| A re-examination of experimental evidence on the spectral dependence of the optical transition matrix element associated with thin-film silicon SB Minar, S Moghaddam, S K. O’Leary Journal of Materials Science: Materials in Electronics, 1–9, 2019 | 3 | 2019 |
| Crystallinity, order, the thin-film silicon continuum, and the spectral dependence of the refractive index in thin silicon films grown through ultra-high-vacuum evaporation for … S Moghaddam, LL Tay, M Noël, JC Zwinkels, JM Baribeau, DJ Lockwood, ... Journal of Non-Crystalline Solids 559, 120657, 2021 | 2 | 2021 |
| A single-oscillator long-wave-length limit Sellmeier equation based fitting approach applied to the case of thin-film silicon and some of its more common alloys S Moghaddam, SK O'Leary Journal of Materials Science: Materials in Electronics, 2021 | 2 | 2021 |
| Thin-film optical function acquisition from experimental measurements of the reflectance and transmittance spectra: a case study S Moghaddam, SH Cheung, M Noël, JC Zwinkels, JM Baribeau, ... Journal of Materials Science: Materials in Electronics 32, 17033-17060, 2021 | 1 | 2021 |
| The optical response of silicon thin-films grown by ultra-high-vacuum evaporation S Moghaddam University of British Columbia, 2022 | | 2022 |
