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Co-authors
Zhenan SunInstitute of Automation, Chinese Academy of SciencesVerified email at nlpr.ia.ac.cn
Yunfan LiuUniversity of Chinese Academy of SciencesVerified email at ucas.ac.cn
Tieniu TanInstitute of Automation, Chinese Academy of SciencesVerified email at nlpr.ia.ac.cn
Ran He, IAPR/IEEE FellowNational Laboratory of Pattern Recognition, CASIAVerified email at nlpr.ia.ac.cn
Muyi SunSchool of AI, BUPT (<< NLPR CASIA << BUPT)Verified email at cripac.ia.ac.cn
Cheng-Zhong Xu, IEEE FellowUniversity of Macau, Macau SAR, ChinaVerified email at um.edu.mo
Fangling JiangUniversity of South ChinaVerified email at usc.edu.cn
Ming-Hsuan YangUniversity of California at Merced; Google DeepMindVerified email at ucmerced.edu
Caifeng ShanPhilips ResearchVerified email at philips.com
Zhouchen LinProfessor, Peking University; Fellow of IEEE, IAPR, CSIG & AAIA; ex-VP of Samsung ResearchVerified email at pku.edu.cn
Siwei Lyu (呂思偉)Professor of CSE, University at Buffalo, SUNYVerified email at buffalo.edu
Wei WangInstitute of Automation, Chinese Academy of SciencesVerified email at nlpr.ia.ac.cn
Bo PengInstitute of Automation, Chinese Academy of SciencesVerified email at nlpr.ia.ac.cn
Yunlong WangInstitute of Automation, Chinese Academy of Sciences (CASIA)Verified email at cripac.ia.ac.cn
Yuan Yan TangUniversity of MacauVerified email at umac.mo
Liang WangNational Lab of Pattern RecognitionVerified email at nlpr.ia.ac.cn