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Co-authors
- Rui ZhangCUHKSZ, SRIBD & National University of SingaporeVerified email at nus.edu.sg
- Kaibin HuangProfessor and Head, Dept. of EEE, University of Hong Kong; IEEE Fellow; ISI Highly Cited ResearcherVerified email at eee.hku.hk
- Liang LiuHighly Cited Researcher, EEE Department, The Hong Kong Polytechnic UniversityVerified email at polyu.edu.hk
- Yong ZengSoutheast University, China; Purple Mountain Laboratories, ChinaVerified email at seu.edu.cn
- Hyojin LeeQualcomm Technologies Inc.Verified email at postech.ac.kr
- Lee JuhoSamsung ElectronicsVerified email at samsung.com