| Learning quality rating of As-Cut mc-Si wafers via convolutional regression networks M Demant, P Virtue, A Kovvali, XY Stella, S Rein IEEE Journal of Photovoltaics 9 (4), 1064-1072, 2019 | 25 | 2019 |
| Visualizing material quality and similarity of mc-Si wafers learned by convolutional regression networks M Demant, P Virtue, A Kovvali, XY Stella, S Rein IEEE Journal of Photovoltaics 9 (4), 1073-1080, 2019 | 18 | 2019 |
| About the relevance of defect features in as-cut multicrystalline silicon wafers on solar cell performance A Kovvali, M Demant, T Trötschler, J Haunschild, S Rein AIP Conference Proceedings 1999 (1), 2018 | 14 | 2018 |
| Deep learning approach to inline quality rating and mapping of multi-crystalline Si-wafers M Demant, P Virtue, AS Kovvali, SX Yu, S Rein Proceedings of the 35th European Photovoltaic Solar Energy Conference and …, 2018 | 10 | 2018 |
| Spatially resolved material quality prediction via constrained deep learning AS Kovvali, M Demant, S Rein 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), 3059-3062, 2019 | 5 | 2019 |
| Machine learning for advanced solar cell production: adversarial denoising, sub-pixel alignment and the digital twin M Demant, L Kurumundayil, P Kunze, A Woernhoer, A Kovvali, S Rein NeurIPS 2020 Workshop Tackling Climate Change with Machine Learning, 7, 2020 | 3 | 2020 |
| “GFVIS”: A NON-DESTRUCTIVE METHOD FOR PHASE FRONT ANALYSIS BASED ON PHOTOS OF BRICK SIDES T Trötschler, AS Kovvali, S Haddouk, A Hess, P Krenckel, H Franz, ... Presented at the 37th European PV Solar Energy Conference and Exhibition 7, 11, 2020 | 2 | 2020 |
| Early Stage Quality Assessment in Silicon Ingots From MDP Brick Characterization AS Kovvali, M Demant, B Rebba, N Schüler, J Haunschild, S Rein Presented at the 37th European PV Solar Energy Conference and Exhibition 7, 11, 2020 | 1 | 2020 |
| The Crystal Growth Explorer: Real-Time Navigable 3D Visualization of Silicon Grains and Defect Related Data in Cast-Mono and Multicrystalline Bricks J Schönauer, M Demant, T Trötschler, AS Kovvali, H Schremmer, ... Presented at the 37th European PV Solar Energy Conference and Exhibition 7, 11, 2020 | | 2020 |
| Verfahren zur Verarbeitung von Abbildungen von Halbleiterstrukturen, sowie zur Prozesscharakterisierung und Prozessoptimierung mittels semantischer Datenkompression M Demant, S Rein, AS Kovvali, J Greulich, N Wöhrle | | 2020 |
Matthias DemantFraunhofer Institute for Solar Energy SystemsVerified email at ise.fraunhofer.de
