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Sylvia J Lewis
Sylvia J Lewis
Unknown affiliation
Verified email at sigray.com
Title
Cited by
Cited by
Year
X-ray surface analysis and measurement apparatus
W Yun, SJY Lewis, J Kirz
US Patent 9,594,036, 2017
662017
X-ray interferometric imaging system
W Yun, SJY Lewis, J Kirz
US Patent 9,719,947, 2017
612017
High brightness X-ray absorption spectroscopy system
W Yun, SJY Lewis, J Kirz
US Patent 9,448,190, 2016
532016
X-ray surface analysis and measurement apparatus
W Yun, SJY Lewis, J Kirz
US Patent 9,823,203, 2017
512017
Structural, dynamic, and chemical complexities in zinc anode of an operating aqueous Zn‐ion battery
G Qian, G Zan, J Li, SJ Lee, Y Wang, Y Zhu, S Gul, DJ Vine, S Lewis, ...
Advanced Energy Materials 12 (21), 2200255, 2022
492022
X-ray method for the measurement, characterization, and analysis of periodic structures
W Yun, SJY Lewis, J Kirz
US Patent 9,874,531, 2018
492018
X-ray transmission spectrometer system
W Yun, S Seshadri, J Kirz, SJY Lewis
US Patent 10,295,485, 2019
452019
X-ray interferometric imaging system
W Yun, SJY Lewis, J Kirz, AF Lyon
US Patent App. 14/527,523, 2015
452015
X-ray illuminators with high flux and high flux density
W Yun, SJY Lewis, J Kirz
US Patent 9,449,781, 2016
442016
X-ray sources using linear accumulation
W Yun, SJY Lewis, J Kirz, AF Lyon
US Patent 9,390,881, 2016
402016
X-ray fluorescence system with high flux and high flux density
W Yun, SJY Lewis, J Kirz
US Patent 9,570,265, 2017
392017
X-ray interferometric imaging system
W Yun, SJY Lewis, J Kirz, AF Lyon
US Patent 10,349,908, 2019
372019
Detector for X-rays with high spatial and high spectral resolution
W Yun, SJY Lewis, J Kirz, BD Stripe
US Patent 10,295,486, 2019
362019
X-ray techniques using structured illumination
W Yun, SJY Lewis, J Kirz
US Patent 10,401,309, 2019
352019
Method and apparatus for x-ray microscopy
W Yun, SJY Lewis, J Kirz, S Seshadri, AF Lyon, D Vine
US Patent 10,352,880, 2019
352019
X-ray sources using linear accumulation
W Yun, SJY Lewis, J Kirz, AF Lyon
US Patent 9,543,109, 2017
322017
Diverging X-ray sources using linear accumulation
W Yun, SJY Lewis, J Kirz, AF Lyon, DC Reynolds
US Patent 10,269,528, 2019
302019
X-ray illuminators with high flux and high flux density
W Yun, SJY Lewis, J Kirz
US Patent App. 15/431,786, 2019
302019
X-ray illumination system with multiple target microstructures
W Yun, SJY Lewis, J Kirz, DC Reynolds, AF Lyon
US Patent 10,297,359, 2019
282019
Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
W Yun, S Seshadri, SJY Lewis, J Kirz, AF Lyon, BD Stripe
US Patent 10,416,099, 2019
262019
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