Thilo Glatzel
Thilo Glatzel
Lecturer, Department of Physics, University of Basel
在 unibas.ch 的电子邮件经过验证 - 首页
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引用次数
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Biophotovoltaics: natural pigments in dye-sensitized solar cells
H Hug, M Bader, P Mair, T Glatzel
Applied Energy 115, 216-225, 2014
3962014
Kelvin probe force microscopy study on conjugated polymer/fullerene bulk heterojunction organic solar cells
H Hoppe, T Glatzel, M Niggemann, A Hinsch, MC Lux-Steiner, ...
Nano letters 5 (2), 269-274, 2005
3382005
Probing atomic structure and Majorana wavefunctions in mono-atomic Fe chains on superconducting Pb surface
R Pawlak, M Kisiel, J Klinovaja, T Meier, S Kawai, T Glatzel, D Loss, ...
npj Quantum Information 2 (1), 1-5, 2016
2732016
High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy
C Sommerhalter, TW Matthes, T Glatzel, A Jäger-Waldau, MC Lux-Steiner
Applied Physics Letters 75 (2), 286-288, 1999
2611999
Amplitude or frequency modulation-detection in Kelvin probe force microscopy
T Glatzel, S Sadewasser, MC Lux-Steiner
Applied surface science 210 (1-2), 84-89, 2003
2582003
Kelvin probe force microscopy: measuring and compensating electrostatic forces
S Sadewasser, T Glatzel
Springer Science & Business Media, 2011
2252011
Kelvin probe force microscopy of semiconductor surface defects
Y Rosenwaks, R Shikler, T Glatzel, S Sadewasser
Physical Review B 70 (8), 085320, 2004
2142004
Efficiency limiting morphological factors of MDMO-PPV: PCBM plastic solar cells
H Hoppe, T Glatzel, M Niggemann, W Schwinger, F Schaeffler, A Hinsch, ...
Thin solid films 511, 587-592, 2006
2122006
High-resolution work function imaging of single grains of semiconductor surfaces
S Sadewasser, T Glatzel, M Rusu, A Jäger-Waldau, MC Lux-Steiner
Applied Physics Letters 80 (16), 2979-2981, 2002
1672002
Kelvin probe force microscopy for the nano scale characterization of chalcopyrite solar cell materials and devices
S Sadewasser, T Glatzel, S Schuler, S Nishiwaki, R Kaigawa, ...
Thin Solid Films 431, 257-261, 2003
1522003
Systematic achievement of improved atomic-scale contrast via bimodal dynamic force microscopy
S Kawai, T Glatzel, S Koch, B Such, A Baratoff, E Meyer
Physical review letters 103 (22), 220801, 2009
1302009
solar cell cross section studied by Kelvin probe force microscopy in ultrahigh vacuum
T Glatzel, DF Marrón, T Schedel-Niedrig, S Sadewasser, MC Lux-Steiner
Applied physics letters 81 (11), 2017-2019, 2002
1282002
Atomic Scale Kelvin Probe Force Microscopy Studies of the Surface Potential Variations on the Surface
GH Enevoldsen, T Glatzel, MC Christensen, JV Lauritsen, F Besenbacher
Physical review letters 100 (23), 236104, 2008
1272008
Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces
C Sommerhalter, T Glatzel, TW Matthes, A Jäger-Waldau, MC Lux-Steiner
Applied surface science 157 (4), 263-268, 2000
1182000
Analytical approach to the local contact potential difference on (001) ionic surfaces: Implications for Kelvin probe force microscopy
F Bocquet, L Nony, C Loppacher, T Glatzel
Physical Review B 78 (3), 035410, 2008
1032008
Texture and electronic activity of grain boundaries in Cu (In, Ga) Se 2 thin films
G Hanna, T Glatzel, S Sadewasser, N Ott, HP Strunk, U Rau, JH Werner
Applied Physics A 82 (1), 1-7, 2006
1032006
Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation
S Sadewasser, T Glatzel, R Shikler, Y Rosenwaks, MC Lux-Steiner
Applied Surface Science 210 (1-2), 32-36, 2003
952003
Electrical activity at grain boundaries of thin films
DF Marrón, S Sadewasser, A Meeder, T Glatzel, MC Lux-Steiner
Physical Review B 71 (3), 033306, 2005
882005
Nanoscale engineering of molecular porphyrin wires on insulating surfaces
S Maier, LA Fendt, L Zimmerli, T Glatzel, O Pfeiffer, F Diederich, E Meyer
Small 4 (8), 1115-1118, 2008
862008
Kelvin probe force microscopy on III–V semiconductors: the effect of surface defects on the local work function
T Glatzel, S Sadewasser, R Shikler, Y Rosenwaks, MC Lux-Steiner
Materials Science and Engineering: B 102 (1-3), 138-142, 2003
852003
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