Follow
Yu Yun Wang
Title
Cited by
Cited by
Year
Demonstration of 64 Conductance States and Large Dynamic Range in Si-doped HfO2 FeFETs under Neuromorphic Computing Operations
YY Wang, KC Wang, CH Wu, TY Chang, N Ronchi, K Banerjee, ...
2022 International Symposium on VLSI Technology, Systems and Applications …, 2022
32022
Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal–Ferroelectric–Insulator–Semiconductor Capacitors
CH Wu, KC Wang, YY Wang, S Mcmitchell, K Banerjee, G van Den Bosch, ...
IEEE Journal of the Electron Devices Society 10, 109-114, 2022
32022
Measuring Local pKa and pH Using Surface Enhanced Raman Spectroscopy of 4-Mercaptobenzoic Acid
YY Wang, H Shi, Y Gong, B Zhang, B Zhao, R Li, SB Cronin
Langmuir 39 (47), 16807-16811, 2023
12023
Enhancement of Ferroelectricity in 5 nm Metal-Ferroelectric-Insulator Technologies by Using a Strained TiN Electrode
CH Wu, KC Wang, YY Wang, C Hu, CJ Su, TL Wu
Nanomaterials 12 (3), 468, 2022
12022
Photoexcited Hot Electron Catalysis in Plasmon-Resonant Grating Structures with Platinum, Nickel, and Ruthenium Coatings
I Aravind, YY Wang, Y Wang, R Li, Z Cai, B Zhao, B Zhang, S Weng, ...
ACS Applied Materials & Interfaces 16 (14), 17393-17400, 2024
2024
A New Methodology to Precisely Induce Wake-Up for Reliability Assessment of Ferroelectric Devices
TT Tan, YY Wang, J Tan, TL Wu, N Raghavan, KL Pey
2023 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2023
2023
Relaxation analysis to understand positive bias induced trapping in ferroelectric FETs with Si and Gd dopants
YY Wang, KC Wang, TY Chang, N Ronchi, B O'Sullivan, K Banerjee, ...
Microelectronics Reliability 138, 114680, 2022
2022
Enhancement of Ferroelectricity in 5-nm HZO Metal-Ferroelectric-Insulator-Semi-conductor Technologies by Using Strained TiN Electrode
CH Wu, KC Wang, YY Wang, TL Wu, CJ Su, YJ Lee, C Hu
International Conference on Solid State Devices and Materials (SSDM), 2021
2021
The system can't perform the operation now. Try again later.
Articles 1–8