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Jing Su
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Layout Hotspot Detection with Feature Tensor Generation and Deep Biased Learning
H Yang, J Su, Y Zou, B Yu, EFY Young
the 54th Annual Design Automation Conference 2017, http://dx.doi.org/10.1145 …, 2017
1462017
Imbalance aware lithography hotspot detection: a deep learning approach
H Yang, L Luo, J Su, C Lin, B Yu
Journal of Micro Nanolithography Mems and Moems 16 (3), doi:10.1117/1.JMM.16 …, 2017
1162017
Imbalance aware lithography hotspot detection: a deep learning approach
H Yang, L Luo, J Su, C Lin, B Yu
SPIE Advanced Lithography 2017 10148, doi:10.1117/12.2258374, 2017
1162017
Time delays in two-photon ionization
J Su, H Ni, A Jaroń-Becker, A Becker
Physical Review Letters 113 (26), 263002, 2014
402014
Methods for training machine learning model for computation lithography
Y Cao, Y Luo, YW Lu, C Been-Der, RC Howell, Y Zou, J Su, ...
US Patent App. 16/970,648, 2020
342020
Numerical simulation of time delays in light-induced ionization
J Su, H Ni, A Becker, A Jaroń-Becker
Physical Review A 87 (3), 033420, 2013
282013
Identification of hot spots or defects by machine learning
J Su, Y Zou, C Lin, S Hunsche, M Jochemsen, YW Lu, LL Cheong
US Patent 11,443,083, 2022
212022
Machine learning assisted SRAF placement for full chip
S Wang, J Su, Q Zhang, W Fong, D Sun, S Baron, C Zhang, C Lin, ...
Photomask Technology 10451, doi: 10.1117/12.2283493, 2017
202017
Efficient full-chip SRAF placement using machine learning for best accuracy and improved consistency
S Wang, S Baron, N Kachwala, C Kallingal, D Sun, V Shu, W Fong, Z Li, ...
Optical Microlithography XXXI 10587, 184-192, 2018
182018
Finite-range time delays in numerical attosecond-streaking experiments
J Su, H Ni, A Becker, A Jaroń-Becker
Physical Review A 88 (2), 023413, 2013
182013
Attosecond-streaking time delays: Finite-range property and comparison of classical and quantum approaches
J Su, H Ni, A Becker, A Jaroń-Becker
Physical Review A 89 (1), 013404, 2014
172014
Training methods for machine learning assisted optical proximity error correction
J Su, YW Lu, Y Luo
US Patent 11,561,477, 2023
132023
Assist feature placement based on machine learning
J Su, Y Zou, C Lin, Y Cao, YW Lu, C Been-Der, Q Zhang, SHL BARON, ...
US Patent App. 16/606,791, 2020
122020
Theoretical analysis of time delays and streaking effects in XUV photoionization
J Su, H Ni, A Becker, A Jaron-Becker
Journal of Modern Optics 60 (17), 1484-1491, 2013
122013
Coloring aware optimization
Y Zou, J Su, RJ Socha, CA Spence, DFS Hsu
US Patent 10,670,973, 2020
62020
Numerical Simulations of Attosecond Streaking Time Delays in Photoionization
J Su, HC Ni, A Becker, A Jaroń-Becker
Chinese Journal of Physics 52 (1), 404-415, 2014
62014
Theoretical Analysis and Numerical Simulation of Attosecond Time Delays in Photoionization
J Su
University of Colorado at Boulder, 2014
52014
Modeling method for computational fingerprints
J Su, Y Cheng, LIN Zchenxi, Y Zou, D Harutyunyan, EP Schmitt-Weaver, ...
US Patent App. 17/634,309, 2022
42022
Method for training machine learning model to determine optical proximity correction for mask
J Tao, SHL Baron, J Su, Y Luo, Y Cao
US Patent App. 17/429,770, 2022
42022
Method for determining curvilinear patterns for patterning device
Q Zhang, C Been-Der, RC Howell, J Su, Y Zou, YW Lu
US Patent 11,232,249, 2022
32022
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