| 6 DOF calibration of profile sensor locations in an inspection station E Morse, P Jaganmohan CIRP Annals 69 (1), 465-468, 2020 | 13 | 2020 |
| X-Ray computed tomography instrument performance evaluation, part III: sensitivity to detector geometry and rotation stage errors at different magnifications P Jaganmohan, B Muralikrishnan, M Shilling, E Morse Journal of Research of the National Institute of Standards and Technology …, 2021 | 4 | 2021 |
| VDI/VDE 2634–1 performance evaluation tests and systematic errors in passive stereo vision systems P Jaganmohan, B Muralikrishnan, V Lee, W Ren, O Icasio-Hernández, ... Precision Engineering 79, 310-322, 2023 | 3 | 2023 |
| Sensitivity to X-Ray Computed Tomography Instrument Geometry Errors as a Function of Rotation Stage Position, Detector Position, and Detector Size B Muralikrishnan, B Muralikrishnan, P Jaganmoha, M Shilling, E Morse US Department of Commerce, National Institute of Standards and Technology, 2021 | 1 | 2021 |
| A dissertation submitted to the faculty of P Jaganmohan The University of North Carolina at Charlotte, 2020 | | 2020 |
| Data Processing, Modeling, and Error Analysis in Discrete Part Geometric Inspection P Jaganmohan The University of North Carolina at Charlotte, 2020 | | 2020 |
| Metrology Bench P Jaganmohan The University of North Carolina at Charlotte, 2017 | | 2017 |
Bala MuralikrishnanNISTVerified email at nist.gov
Bala MuralikrishnanNISTVerified email at nist.gov
Meghan ShillingNISTVerified email at nist.gov