| AdaTrust: Combinational Hardware Trojan Detection Through Adaptive Test Pattern Construction C Nigh, A Orailoglu IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (3), 544-557, 2021 | 14 | 2021 |
| Test pattern superposition to detect hardware Trojans C Nigh, A Orailoglu 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 25-30, 2020 | 5 | 2020 |
| Aaa: Automated, on-ate ai debug of scan chain failures C Nigh, G Bhargava, RD Blanton 2021 IEEE International Test Conference (ITC), 314-318, 2021 | 4 | 2021 |
| Improving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization MT Wu, CS Kuo, JCM Li, C Nigh, G Bhargava 2021 IEEE International Test Conference (ITC), 251-259, 2021 | 2 | 2021 |
| Taming combinational Trojan detection challenges with self-referencing adaptive test patterns C Nigh, A Orailoglu 2020 IEEE 38th VLSI Test Symposium (VTS), 1-6, 2020 | 2 | 2020 |
| PEPR: Pseudo-Exhaustive Physically-Aware Region Testing W Li, C Nigh, D Duvalsaint, S Mitra, RD Blanton 2022 IEEE International Test Conference (ITC), 314-323, 2022 | 1 | 2022 |
| Systematic hold-time fault diagnosis and failure debug in production chips CY Liu, MT Wu, JCM Li, G Bhargava, C Nigh 2020 IEEE 29th Asian Test Symposium (ATS), 1-7, 2020 | 1 | 2020 |
| Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis BH Hsieh, YS Liu, JCM Li, C Nigh, M Chern, G Bhargava 2023 IEEE International Test Conference (ITC), 293-302, 2023 | | 2023 |
| Diagnosing Double Faulty Chains through Failing Bit Separation CS Kuo, BH Hsieh, JCM Li, C Nigh, G Bhargava, M Chern 2022 IEEE International Test Conference (ITC), 175-184, 2022 | | 2022 |
| Faulty Function Extraction for Defective Circuits C Nigh, R Purdy, W Li, S Mitra, RD Blanton | | |
