追蹤
Jaesung Jo
Jaesung Jo
Device engineer, Intel Corporation
在 intel.com 的電子郵件地址已通過驗證
標題
引用次數
引用次數
年份
Negative capacitance field effect transistor with hysteresis-free sub-60-mV/decade switching
J Jo, C Shin
IEEE Electron Device Letters 37 (3), 245-248, 2016
2272016
Negative capacitance in organic/ferroelectric capacitor to implement steep switching MOS devices
J Jo, WY Choi, JD Park, JW Shim, HY Yu, C Shin
Nano letters 15 (7), 4553-4556, 2015
1982015
Impact of temperature on negative capacitance field‐effect transistor
J Jo, C Shin
Electronics Letters 51 (1), 106-108, 2015
502015
Specific Contact Resistivity Reduction Through Ar Plasma-Treated TiO2−xInterfacial Layer to Metal/Ge Contact
GS Kim, JK Kim, SH Kim, J Jo, C Shin, JH Park, KC Saraswat, HY Yu
IEEE Electron Device Letters 35 (11), 1076-1078, 2014
412014
Experimental observation of voltage amplification using negative capacitance for sub-60 mV/decade CMOS devices
J Jo, C Shin
Current Applied Physics 15 (3), 352-355, 2015
342015
Plasma-enhanced atomic layer deposition of p-type copper oxide semiconductors with tunable phase, oxidation state, and morphology
JD Lenef, J Jo, O Trejo, DJ Mandia, RL Peterson, NP Dasgupta
The Journal of Physical Chemistry C 125 (17), 9383-9390, 2021
242021
Causes of the Difference Between Hall Mobility and Field-Effect Mobility for p-Type RF Sputtered Cu₂O Thin-Film Transistors
J Jo, JD Lenef, K Mashooq, O Trejo, NP Dasgupta, RL Peterson
IEEE Transactions on Electron Devices 67 (12), 5557-5563, 2020
222020
Experimental and theoretical study of hole scattering in RF sputtered p-type Cu2O thin films
J Jo, Z Deng, N Sanders, E Kioupakis, RL Peterson
Applied Physics Letters 120 (11), 2022
82022
Transconductance amplification by the negative capacitance in ferroelectric-gated P3HT thin-film transistor
J Jo, MG Kim, H Lee, H Choi, C Shin
IEEE Transactions on Electron Devices 64 (12), 4974-4979, 2017
82017
Capacitance matching effects in negative capacitnace field effect transistor
J Jo, AI Khan, K Cho, S Oh, S Salahuddin, C Shin
2016 IEEE Silicon Nanoelectronics Workshop (SNW), 174-175, 2016
82016
Study of temperature effects on negative capacitance field-effect transistor
J Jo, C Shin
IEEK 37, 70-72, 2014
82014
Extraction of SnO subbandgap defect density by numerical modeling of p-type TFTs
K Mashooq, J Jo, RL Peterson
IEEE Transactions on Electron Devices 69 (5), 2436-2442, 2022
62022
Worst case sampling method with confidence ellipse for estimating the impact of random variation on static random access memory (SRAM)
S Oh, J Jo, H Lee, GS Lee, JD Park, C Shin
JSTS: Journal of Semiconductor Technology and Science 15 (3), 374-380, 2015
52015
Demonstration and analysis of ambipolar SnO inverter with high gain
K Mashooq, J Jo, RL Peterson
Applied Physics Letters 122 (1), 2023
32023
Amorphous Indium Zinc Oxide Thin-Film Transistor with Steep Subthreshold Slope by Negative Capacitance
K Cho, J Jo, C Shin
IEICE Transactions on Electronics 99 (5), 544-546, 2016
12016
Effect of Metal Capping Layer in Achieving Record High p-Type SnO Thin Film Transistor Mobility
K Mashooq, J Jo, RL Peterson
IEEE Transactions on Electron Devices, 2023
2023
Tunable Sulfur Incorporation into Atomic Layer Deposition Films Using Solution Anion Exchange
JD Lenef, AJ Gayle, J Jo, KM Fuelling, SK Yadavalli, AM Ortiz-Ortiz, K Sun, ...
Chemistry of Materials 35 (6), 2503-2517, 2023
2023
Investigation of p-type Oxide Semiconductor Thin Film Transistors for Complementary Metal Oxide Semiconductor Technologies
J Jo
2022
Layout engineering to suppress hysteresis of negative capacitance FinFET
E Ko, J Jo, C Shin, BY Nguyen
2017 IEEE International Conference on IC Design and Technology (ICICDT), 1-3, 2017
2017
Experimental Observation of Negative Capacitance in Organic/Ferroelectric Capacitor for Steep Switching MOSFET
Y Lee, J Jo, K Cho, S Oh, JD Park, C Shin
Journal of Nanoscience and Nanotechnology 17 (5), 3469-3471, 2017
2017
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