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Sander den Hoedt
Sander den Hoedt
DELMIV BV
Verified email at delmic.com
Title
Cited by
Cited by
Year
A new cathodoluminescence system for nanoscale optics, materials science, and geology
T Coenen, SV Den Hoedt, A Polman
Microscopy Today 24 (3), 12-19, 2016
142016
A cryogenic, coincident fluorescence, electron, and ion beam microscope
DB Boltje, JP Hoogenboom, AJ Jakobi, GJ Jensen, CTH Jonker, MJ Kaag, ...
Elife 11, e82891, 2022
102022
ENZEL-A cryogenic, retrofittable, coincident fluorescence, electron, and ion beam solution for the cryo-electron tomography workflow.
D Boltje, J Hoogenboom, A Jakobi, G Jensen, C Jonker, A Koster, M Last, ...
Microscopy and Microanalysis 27 (S1), 3228-3229, 2021
22021
The SECOM platform: an integrated CLEM solution
SV den Hoedt, APJ Effting, MT Haring
Microscopy and Microanalysis 20 (S3), 1006-1007, 2014
22014
Fluorescence-guided lamella fabrication with ENZEL, an integrated cryogenic CLEM solution for the cryo-electron tomography workflow
C Jonker, D Boltje, J Hoogenboom, A Jakobi, G Jensen, A Koster, M Last, ...
Microscopy and Microanalysis 27 (S1), 3234-3235, 2021
12021
Method and apparatus for micromachining a sample using a focused ion beam
APJ Effting, SV Den Hoedt
US Patent App. 18/016,057, 2023
2023
Integrated optical and charged particle inspection apparatus
S Den Hoedt, JP Hoogenboom
US Patent 11,742,173, 2023
2023
Method and manipulation device for handling samples
SV Den Hoedt
US Patent App. 17/784,283, 2023
2023
Method and apparatus for inspecting a sample by means of multiple charged particle beamlets
APJ Effting, SV Den Hoedt
US Patent App. 17/790,996, 2023
2023
A Cryogenic Fluorescence Microscope Retrofittable in Coincidence with a FIB/SEM
DB Boltje, JP Hoogenboom, AJ Jakobi, GJ Jensen, CTH Jonker, ...
Microscopy and Microanalysis 28 (S1), 1276-1278, 2022
2022
Method for integrated acquisition and registration of large-scale microscopy image data
JP Hoogenboom, AS Raja, SV den Hoedt, R Lane
2021
A meeting of microscopic strengths
LM Voortman, SV den Hoedt, JP Hoogenboom
Laboratory News, Companion Series, 16-17, 2014
2014
Microscope sees double
J Hoogenboom, S Den Hoedt, J Wassink
Delft University of Technology, 2012
2012
Fluorescence-guided lamella fabrication for cryo-electron tomography with ENZEL, an integrated cryogenic CLEM solution
C Jonker, D Boltje, J Hoogenboom, A Jakobi, G Jensen, A Koster, M Last, ...
SAMPLE PREPARATION
LM Voortman, NCM van der Veeken, JP Hoogenboom, SV den Hoedt
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