| A simulation study of nbti impact on 14-nm node finfet technology for logic applications: Device degradation to circuit-level interaction S Mishra, H Amrouch, J Joe, CK Dabhi, K Thakor, YS Chauhan, J Henkel, ... IEEE Transactions on Electron Devices 66 (1), 271-278, 2018 | 53 | 2018 |
| Impact of BTI on dynamic and static power: From the physical to circuit level H Amrouch, S Mishra, V van Santen, S Mahapatra, J Henkel 2017 IEEE International Reliability Physics Symposium (IRPS), CR-3.1-CR-3.6, 2017 | 42 | 2017 |
| Device to circuit framework for activity-dependent nbti aging in digital circuits A Thirunavukkarasu, H Amrouch, J Joe, N Goel, N Parihar, S Mishra, ... IEEE Transactions on Electron Devices 66 (1), 316-323, 2018 | 28 | 2018 |
| TCAD-based Predictive NBTI Framework for Sub-20nm node Device Design Considerations S Mishra, HY Wong, R Tiwari, A Chaudhary, R Rao, V Moroz, S Mahaptra TED, 2016 | 28 | 2016 |
| Predictive TCAD for NBTI stress-recovery in various device architectures and channel materials S Mishra, HY Wong, R Tiwari, A Chaudhary, N Parihar, R Rao, S Motzny, ... 2017 IEEE International Reliability Physics Symposium (IRPS), 6A-3.1-6A-3.8, 2017 | 18 | 2017 |
| NBTI-related variability impact on 14-nm node FinFET SRAM performance and static power: Correlation to time zero fluctuations S Mishra, N Parihar, R Anandkrishnan, CK Dabhi, YS Chauhan, ... IEEE Transactions on Electron Devices 65 (11), 4846-4853, 2018 | 12 | 2018 |
| On the Impact of Time-Zero Variability, Variable NBTI, and Stochastic TDDB on SRAM Cells S Mishra, S Mahaptra TED, 2016 | 12 | 2016 |
| FinFET NBTI degradation reduction and recovery enhancement through hydrogen incorporation and self-heating HY Wong, S Motzny, V Moroz, S Mishra, S Mahapatra 2017 International Conference on Simulation of Semiconductor Processes and …, 2017 | 5 | 2017 |
| A BTI analysis tool (BAT) to simulate p-MOSFET ageing under diverse experimental conditions S Mahapatra, N Parihar, S Mishra, B Fernandez, A Chaudhary 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM …, 2017 | 3 | 2017 |
| System and method of simulating aging in device circuits S Mishra, P Weckx, F Catthoor, A Spessot US Patent 20,220,100,939, 2022 | 2 | 2022 |
| Fast & accurate methodology for aging incorporation in circuits using adaptive waveform splitting (AWS) S Mishra, P Weckx, JY Lin, B Kaczer, D Linten, A Spessot, F Catthoor 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 2 | 2020 |
| Impact of 3-D Integration on Thermal Performance of RISC-V MemPool Multicore SOC S Venkateswarlu, S Mishra, H Oprins, B Vermeersch, M Brunion, JH Han, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2023 | 1 | 2023 |
| Thermal Performance Analysis of Mempool RISC-V Multicore SoC S Venkateswarlu, S Mishra, H Oprins, B Vermeersch, M Brunion, JH Han, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2022 | 1 | 2022 |
| Multitimescale Mitigation for Performance Variability Improvement in Time-Critical Systems JY Lin, P Weckx, S Mishra, A Spessot, F Catthoor IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2022 | 1 | 2022 |
| Proactive Run-Time Mitigation for Time-Critical Applications Using Dynamic Scenario Methodology JY Lin, P Weckx, S Mishra, A Spessot, F Catthoor 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022 | 1 | 2022 |
| Overhead Reduction with Optimal Margining Using A Reliability Aware Design Paradigm S Mishra, P Weckx, O Zografos, JY Lin, A Spessot, F Catthoor 2021 IEEE International Reliability Physics Symposium (IRPS), 2021 | 1 | 2021 |
| Towards Chip-Package-System Co-optimization of Thermally-limited System-On-Chips (SOCs) S Mishra, V Sankatali, B Vermeersch, M Brunion, M Lofrano, D Abdi, ... 2023 IEEE International Reliability Physics Symposium (IRPS), 2023 | | 2023 |
| Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level B Ranjbar, F Klemme, PR Genssler, H Amrouch, J Jung, S Dave, H So, ... Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023 | | 2023 |
| Electromigration-aware design technology co-optimization for SRAM in advanced technology nodes M Mayahinia, HH Liu, S Mishra, Z Tokei, F Catthoor, M Tahoori Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023 | | 2023 |
Souvik MahapatraProfessor, EE Dept, IIT Bombay (Fellow of IEEE, INSA, IASc, INAE)Verified email at ee.iitb.ac.in
