| A Comprehensive Evaluation of Contact Recombination and Contact Resistivity Losses in Industrial Silicon Solar Cells M Li, N Iqbal, Z Yang, X Lin, NK Pannaci, C Avalos, T Shaw, K Davis IEEE Journal of Photovoltaics 10 (5), 1277-1282, 2020 | 22 | 2020 |
| Improving the Accuracy of Pixel-level Defect Classification of Electroluminescence Images M Li, J Fioresi, NK Pannaci, KO Davis 2021 IEEE 48th Photovoltaic Specialists Conference (PVSC), 1458-1459, 2021 | 2 | 2021 |
| Spatially Resolved Series Resistance Analysis of PV Modules using Electroluminescence and Photoluminescence Images M Li, MJ Hossain, C Weik, NK Pannaci, N Iqbal, D Colvin, KO Davis 2021 IEEE 48th Photovoltaic Specialists Conference (PVSC), 1476-1477, 2021 | 2 | 2021 |
| Spatially Resolved Modelling and Analysis of PV Module Failures using Griddler J Pivnik, A Jimenez, NK Pannaci, J Oh, M Li, H Seigneur 2021 IEEE 48th Photovoltaic Specialists Conference (PVSC), 1584-1585, 2021 | | 2021 |
| Characterization of contact resistance properties of different TLM structure designs NA Karam Pannaci | | 2020 |
