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Lachlan Oberg
Lachlan Oberg
PhD Student, Department of quantum science and technology, Research School of Physics, Australian
Verified email at anu.edu.au - Homepage
Title
Cited by
Cited by
Year
Nanoscale vector electric field imaging using a single electron spin
MSJ Barson, LM Oberg, LP McGuinness, A Denisenko, NB Manson, ...
Nano Letters 21 (7), 2962-2967, 2021
332021
Optimized fast gates for quantum computing with trapped ions
EPG Gale, Z Mehdi, LM Oberg, AK Ratcliffe, SA Haine, JJ Hope
Physical Review A 101 (5), 052328, 2020
262020
Solution to electric field screening in diamond quantum electrometers
LM Oberg, MO de Vries, L Hanlon, K Strazdins, MSJ Barson, MW Doherty, ...
Physical Review Applied 14 (1), 014085, 2020
182020
Spin coherent quantum transport of electrons between defects in diamond
LM Oberg, E Huang, PM Reddy, A Alkauskas, AD Greentree, JH Cole, ...
Nanophotonics 8 (11), 1975-1984, 2019
162019
Micromotion-enhanced fast entangling gates for trapped-ion quantum computing
AK Ratcliffe, LM Oberg, JJ Hope
Physical Review A 101 (5), 052332, 2020
132020
Nitrogen overgrowth as a catalytic mechanism during diamond chemical vapour deposition
LM Oberg, M Batzer, A Stacey, MW Doherty
Carbon 178, 606-615, 2021
72021
NV with nitrogen
NB Manson, MSJ Barson, M Hedges, P Singh, S Stearn, Y Chen, L Oberg, ...
arXiv preprint arXiv:2311.09570, 2023
12023
Spin-to-Charge conversion with electrode confinement in diamond
L Hanlon, L Oberg, YH Chen, MW Doherty
Physical Review Applied 16 (6), 064050, 2021
12021
Semiempirical ab initio modeling of bound states of deep defects in semiconductor quantum technologies
YH Chen, L Oberg, J Flick, A Lozovoi, CA Meriles, MW Doherty
Physical Review B 109 (20), L201115, 2024
2024
Atom-scale Fabrication and Applications of Diamond Quantum Devices
L Oberg
The Australian National University, 2024
2024
Atomic scale fabrication of diamond quantum computers
M Dohery, L Oberg, C Weber, T Sergeieva, C Pakes, A Schenk, A Stacey
WO Patent WO2,023,097,361, 2023
2023
Semi- modeling of bound states of deep defects in semiconductors
YH Chen, L Oberg, J Flick, A Lozovoi, CA Meriles, MW Doherty
arXiv preprint arXiv:2306.12005, 2023
2023
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