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Ankit Bende
Ankit Bende
PhD Researcher, RWTH University | Forschungszentrum Juelich
Verified email at fz-juelich.de - Homepage
Title
Cited by
Cited by
Year
Experimental Validation of Memristor-Aided Logic Using 1T1R TaOx RRAM Crossbar Array
A Bende, S Singh, CK Jha, T Kempen, F Cüppers, C Bengel, A Zambanini, ...
2024 37th International Conference on VLSI Design and 2024 23rd ¡K, 2024
92024
Should we even optimize for execution energy? rethinking mapping for magic design style
S Singh, CK Jha, A Bende, PL Thangkhiew, V Rana, S Patkar, ...
IEEE Embedded Systems Letters, 2023
72023
Error Detection and Correction Codes for Safe In-Memory Computations
L Parrini, T Soliman, B Hettwer, JM Borrmann, S Singh, A Bende, V Rana, ...
arXiv preprint arXiv:2404.09818, 2024
42024
A differential OTP memory based highly unique and reliable PUF at 180 nm technology node
P Malviya, S Sadana, A Lele, K Priyadarshi, A Sharma, A Naik, L Bandhu, ...
Solid-State Electronics 188, 108207, 2022
42022
MemSPICE: Automated simulation and energy estimation framework for magic-based logic-in-memory
S Singh, CK Jha, A Bende, V Rana, S Patkar, R Drechsler, F Merchant
2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC), 282-287, 2024
32024
A flexible and fast digital twin for RRAM systems applied for training resilient neural networks
M Fritscher, S Singh, T Rizzi, A Baroni, D Reiser, M Mallah, D Hartmann, ...
Scientific Reports 14 (1), 23695, 2024
12024
In-Memory Mirroring: Cloning Without Reading
S Singh, A Bende, CK Jha, V Rana, R Drechslert, S Patkar, F Merchant
2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration ¡K, 2024
12024
Neural in-memory checksums: an error detection and correction technique for safe in-memory inference
L Parrini, T Soliman, B Hettwer, C De La Parra, JM Borrmann, S Singh, ...
Philosophical Transactions A 383 (2288), 20230399, 2025
2025
One-Time Programmable Memory for Ultra-Low Power ANN Inference Accelerator With Security Against Thermal Fault Injection
S Deshmukh, A Bende, D Sanghai, V Saraswat, A Biswas, A Kadam, ...
IEEE Journal of the Electron Devices Society, 2024
2024
Resilience of Digital and Analog RRAM-Based ML Models to Device Variability: A Comparative Study
T Glint, G Paul, A Bende, R Dittmann, V Rana
2024 31st IEEE International Conference on Electronics, Circuits and Systems ¡K, 2024
2024
Sequence Detection in Bilayer 1T1R RRAM Device with Integrated State Machine
S Singh, G Paul, A Bende, T Kempen, F Cüppers, S Patkar, V Rana, ...
2024
Variability Reduction with Bilayer RRAM Device
T Kempen, A Bende, A Sarantopoulos, R Dittmann, C Bengel, ...
2023 18th International Workshop on Cellular Nanoscale Networks and their ¡K, 2023
2023
Indigenous Fab-Lab Hybrid Device Integration for Phase Change Memory for In-Memory Computing
W Uddin, A Bende, A Singh, T Malviya, R Ranjan, K Priyadarshi, ...
International Symposium on VLSI Design and Test, 468-477, 2022
2022
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