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Markus Müller
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Solution shearing of a high‐capacitance polymer dielectric for low‐voltage organic transistors
K Haase, J Zessin, K Zoumboulis, M Müller, M Hambsch, SCB Mannsfeld
Advanced Electronic Materials 5 (6), 1900067, 2019
262019
Advanced SiGe: C HBTs at cryogenic temperatures and their compact modeling with temperature scaling
X Jin, M Müller, P Sakalas, A Mukherjee, Y Zhang, M Schröter
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits 7 …, 2021
202021
Advances in foundry SiGe HBT BiCMOS processes through modeling and device scaling for ultra-high speed applications
S Phillips, E Preisler, J Zheng, S Chaudhry, M Racanelli, M Müller, ...
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2021
152021
1-D drift-diffusion simulation of two-valley semiconductors and devices
M Müller, P Dollfus, M Schröter
IEEE Transactions on Electron Devices 68 (3), 1221-1227, 2021
142021
VerilogAE: An open source Verilog-A compiler for compact model parameter extraction
P Kuthe, M Müller, M Schröter
IEEE Journal of the Electron Devices Society 8, 1416-1423, 2020
142020
Methods for extracting the temperature-and power-dependent thermal resistance for SiGe and III-V HBTs from DC measurements: A review and comparison across technologies
M Müller, V d’Alessandro, S Falk, C Weimer, X Jin, M Krattenmacher, ...
IEEE Transactions on Electron Devices 69 (8), 4064-4074, 2022
112022
Compact modeling of SiGe HBTs for design of cryogenic control and readout circuits for quantum computing
H Ying, SG Rao, JW Teng, M Frounchi, M Müller, X Jin, M Schröter, ...
2020 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2020
112020
A W-Band SiGe-HBT colpitts VCO for millimeter-wave applications with an analog tuning range of 12%
E Vardarli, M Müller, M Schröter
2022 IEEE 22nd Topical Meeting on Silicon Monolithic Integrated Circuits in …, 2022
92022
An experimental load-pull based large-signal RF reliability study of SiGe HBTs
C Weimer, P Sakalas, M Müller, GG Fischer, M Schröter
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2021
82021
Characterization and modeling of thermal coupling in multi-finger InP DHBTs
M Müller, T Nardmann, M Froitzheim, M Schröter
2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2022
72022
Experimental determination, modeling, and simulation of nonlinear thermal effects in bipolar transistors under static conditions: A critical review and update
V d’Alessandro, AP Catalano, C Scognamillo, M Müller, M Schröter, ...
Energies 15 (15), 5457, 2022
72022
Augmented drift-diffusion transport for the simulation of advanced SiGe HBTs
M Müller, M Schröter, C Jungemann, C Weimer
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2021
72021
Multi-Finger 250-nm InP/GaAsSb DHBTs with Record 37.3% Class-A PAE at 94 GHz
S Hamzeloui, AM Arabhavi, F Ciabattini, M Ebrahimi, M Müller, O Ostinelli, ...
2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2023
62023
Device modeling tools and their application to SiGe HBT development
M Schröter, M Müller, M Krattenmacher
2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2022
62022
Analytical modeling and numerical simulation of nonlinear thermal effects in bipolar transistors
V D'Alessandro, C Scognamillo, AP Catalano, M Müller, M Schröter, ...
2022 28th International Workshop on Thermal Investigations of ICs and …, 2022
62022
Nonlinear compact modeling of InP/InGaAs DHBTs with HICUM/L2
M Müller, C Weimer, M Schröter
ESSDERC 2023-IEEE 53rd European Solid-State Device Research Conference …, 2023
52023
RF reliability of SiGe and InP HBTs: A comparative study
C Weimer, M Müller, E Vardarli, M Claus, M Schröter
2023 IEEE/MTT-S International Microwave Symposium-IMS 2023, 8-11, 2023
52023
DMT—Device-modeling-toolkit
K Krattenmacher, M Müller, M Schröter
Proc. HICUM Workshop, 2019
52019
Physical modeling of InP/InGaAs DHBTs with augmented drift-diffusion and Boltzmann transport equation solvers—Part II: Application and results
M Müller, H Leenders, C Jungemann, M Schröter
IEEE Transactions on Electron Devices, 2023
42023
A Critical Review of Techniques for the Experimental Extraction of the Thermal Resistance of Bipolar Transistors from DC Measurements—Part I: Thermometer-Based Approaches
V d’Alessandro, AP Catalano, C Scognamillo, M Müller, M Schröter, ...
Electronics 12 (16), 3471, 2023
42023
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