| Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits M Bushnell, V Agrawal Springer Science & Business Media, 2004 | 2715 | 2004 |
| A tutorial on built-in self-test. I. Principles VD Agrawal, CR Kime, KK Saluja IEEE Design & Test of Computers 10 (1), 73-82, 1993 | 485* | 1993 |
| A partial scan method for sequential circuits with feedback KT Cheng, VD Agrawal IEEE Transactions on Computers 39 (4), 544-548, 1990 | 455 | 1990 |
| Scheduling tests for VLSI systems under power constraints RM Chou, KK Saluja, VD Agrawal IEEE Transactions on Very Large Scale Integration (VLSI) Systems 5 (2), 175-185, 1997 | 365 | 1997 |
| Chip layout optimization using critical path weighting AE Dunlop, VD Agrawal, DN Deutsch, MF Jukl, P Kazak Papers on Twenty-five years of electronic design automation, 278-281, 1988 | 278 | 1988 |
| Single event upset: An embedded tutorial F Wang, VD Agrawal 21st International Conference on VLSI Design (VLSID 2008), 429-434, 2008 | 271 | 2008 |
| PREDICT: Probabilistic estimation of digital circuit testability SC Seth Proc. 15th Int. Fault-Tolerant Computer Symp., 220-225, 1985 | 250 | 1985 |
| A transitive closure algorithm for test generation ST Chakradhar, VD Agrawal, SG Rothweiler IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1993 | 231 | 1993 |
| An exact algorithm for selecting partial scan flip-flops ST Chakradhar, A Balakrishnan, VD Agrawal Proceedings of the 31st annual Design Automation Conference, 81-86, 1994 | 219 | 1994 |
| Statistical fault analysis SK Jain, VD Agrawal IEEE Design & Test of Computers 2 (1), 38-44, 1985 | 201 | 1985 |
| Robust tests for stuck-open faults in CMOS combinational logic circuits SM Reddy, MK Reddy, VD Agrawal Proc. Int. Symp. on Fault-Tolerant Computing, 44-49, 1984 | 188 | 1984 |
| Test generation for MOS circuits using D-algorithm SK Jain, VD Agrawal 20th Design Automation Conference Proceedings, 64-70, 1983 | 182 | 1983 |
| Designing circuits with partial scan VD Agrawal, KT Cheng, DD Johnson, TS Lin IEEE Design & Test of Computers 5 (2), 8-15, 1988 | 178 | 1988 |
| Tutorial test generation for VLSI chips VD Agrawal, SC Seth (No Title), 1988 | 174 | 1988 |
| Fault coverage requirement in production testing of LSI circuits VD Agrawal, SC Seth, P Agrawal IEEE Journal of Solid-State Circuits 17 (1), 57-61, 1982 | 154 | 1982 |
| Segment delay faults: A new fault model K Heragu, JH Patel, VD Agrawal Proceedings of 14th VLSI Test Symposium, 32-39, 1996 | 148 | 1996 |
| Sampling techniques for determining fault coverage in LSI circuits VD Agrawal Journal of Digital Systems 5 (3), 189-202, 1981 | 141 | 1981 |
| Delay fault models and test generation for random logic sequential circuits TJ Chakraborty, VD Agrawal, ML Bushnell Annual ACM IEEE Design Automation Conference: Proceedings of the 29 th ACM …, 1992 | 139 | 1992 |
| STAFAN: An alternative to fault simulation SK Jain, VD Agrawal Papers on Twenty-five years of electronic design automation, 475-480, 1988 | 136 | 1988 |
| Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits V Agrawal, M Bushnell Frontiers in Electronic Testing, Springer, 2000 | 135 | 2000 |
Prathima AgrawalProfessor of electrical and computer engineeringVerified email at auburn.edu
