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Yiguang Zhang
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Full-field deformation measurements in the transmission electron microscope using digital image correlation and particle tracking
Y Zhang, L Feng, S Dillon, J Lambros
Materials Characterization 183, 111598, 2022
112022
Creep Characterization of Amorphous SiO2 in the Transmission Electron Microscope Using Digital Image Correlation and Finite Element Analysis
Y Zhang, S Dillon, J Lambros
Experimental Mechanics 63 (4), 621-636, 2023
2023
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Articles 1–2