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Ahmad Chaker
Ahmad Chaker
Process Development Engineer, Sivers Photonics
Verified email at sivers-photonics.com
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Cited by
Cited by
Year
Plasma deposition—Impact of ions in plasma enhanced chemical vapor deposition, plasma enhanced atomic layer deposition, and applications to area selective deposition
C Vallée, M Bonvalot, S Belahcen, T Yeghoyan, M Jaffal, R Vallat, ...
Journal of Vacuum Science & Technology A 38 (3), 2020
412020
Evolution of crystal structure during the initial stages of ZnO atomic layer deposition
R Boichot, L Tian, MI Richard, A Crisci, A Chaker, V Cantelli, S Coindeau, ...
Chemistry of Materials 28 (2), 592-600, 2016
412016
Understanding the mechanisms of interfacial reactions during TiO2 layer growth on RuO2 by atomic layer deposition with O2 plasma or H2O as oxygen source
A Chaker, PD Szkutnik, J Pointet, P Gonon, C Vallée, A Bsiesy
Journal of Applied Physics 120 (8), 2016
242016
An atomistic view of the incipient growth of zinc oxide nanolayers
MH Chu, L Tian, A Chaker, V Cantelli, T Ouled, R Boichot, A Crisci, S Lay, ...
Crystal Growth & Design 16 (9), 5339-5348, 2016
182016
Nanoscale patterning of zinc oxide from zinc acetate using electron beam lithography for the preparation of hard lithographic masks
A Chaker, HR Alty, P Tian, A Kotsovinos, GA Timco, CA Muryn, SM Lewis, ...
ACS Applied Nano Materials 4 (1), 406-413, 2020
162020
Topographically selective deposition
A Chaker, C Vallée, V Pesce, S Belahcen, R Vallat, R Gassilloud, ...
Applied Physics Letters 114 (4), 2019
162019
Controlling the Current Conduction Asymmetry of HfO2 Metal–Insulator–Metal Diodes by Interposing Al2O3 Layer
W Jeon, O Salicio, A Chaker, P Gonon, C Vallée
IEEE Transactions on Electron Devices 66 (1), 402-406, 2018
132018
Control of ion energy during plasma enhanced atomic layer deposition: A new strategy for the modulation of TiN growth delay on SiO2
S Belahcen, C Vallée, A Bsiesy, A Chaker, M Jaffal, T Yeghoyan, ...
Journal of Vacuum Science & Technology A 39 (1), 2021
92021
High capacitance density of 185 nF/mm2 achieved in three-dimensional MIM structures using TiO2 as a dielectric
A Chaker, P Gonon, C Vallée, A Bsiesy
Applied Physics Letters 110 (24), 2017
92017
Evaluation of Alternative Atomistic Models for the Incipient Growth of ZnO by Atomic Layer Deposition
MH Chu, L Tian, A Chaker, E Skopin, V Cantelli, T Ouled, R Boichot, ...
Journal of Electronic Materials 46, 3512-3517, 2017
92017
Wide Band Frequency Characterization of Al-Doped and Undoped Rutile TiO2 Thin Films for MIM Capacitors
A Chaker, C Bermond, P Artillan, P Gonon, C Vallée, A Bsiesy
IEEE Electron Device Letters 38 (3), 375-378, 2017
72017
Negative Tone Metallic Organic Resists with Improved Sensitivity for Plasma Etching: Implications for Silicon Nanostructure Fabrication and Photomask Production
A Chaker, HA Alty, P Winpenny, GFS Whitehead, GA Timco, SM Lewis, ...
ACS Applied Nano Materials 5 (12), 17538-17543, 2022
12022
Understanding the mechanisms of interfacial reactions during TiO {sub 2} layer growth on RuO {sub 2} by atomic layer deposition with O {sub 2} plasma or H {sub 2} O as oxygen …
A Chaker, PD Szkutnik, J Pointet, P Gonon, C Vallée
Journal of Applied Physics 120 (8), 2016
12016
Method for forming spacers of a transistor
N Posseme, M Bonvalot, A Chaker, C Vallee
US Patent 11,393,689, 2022
2022
High k Dielectrics for MIM Architecture: From Capacitors to Non-volatile Memories Applications
C Vallée, P Gonon, W Jeona, M Saadi, C Mannequin, T Wakrim, C Nail, ...
ICMCTF 2021-47th International Conference On Metallurgical Coatings & Thin Films, 2021
2021
Top and Bottom Ta2O5 Topographical Selective Deposition on 3D structures by Plasma Enhanced Atomic Layer Deposition
T Yeghoyan, M Jaffal, V Pesce, G Lefevre, A Chaker, S David, ...
7th International Atomic Layer Etching Workshop (ALE 2020), 2020
2020
Topographic Area Selective Deposition (TSD): a comparison between PEALD/q-ALE and PEALD/sputtering approaches
M Jaffal, T Yeghoyan, V Pesce, G Lefevre, A Chaker, S David, ...
7th International Atomic Layer Etching Workshop (ALE 2020), 2020
2020
(Invited) PEALD and ALE for Area Selective Deposition
C Vallée, M Bonvalot, R Gassilloud, V Pesce, A Chaker, S Belahcen, ...
Electrochemical Society Meeting Abstracts 236, 1139-1139, 2019
2019
Method for corming spacers of a transistor
A Chaker, M Bonvalot, C Vallée, N Possémé
2019
Single batch strategies for the development of an Area Selective Deposition process with the deposition/etch approach
C Vallee, M Bonvalot, R Gassilloud, V Pesce, A Chaker, S Belahcen, ...
19th International Conference on Atomic layer Deposition (ALD2019), 2019
2019
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