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合著作者
- Minghao QiPurdue University在 purdue.edu 的电子邮件经过验证
- Andrew M. WeinerProfessor of Electrical and Computer Engineering, Purdue University在 purdue.edu 的电子邮件经过验证
- Yi XUANUniversity of Pittsburgh, School of Medicine在 pitt.edu 的电子邮件经过验证
- Sangsik KimAssociate Professor of Electrical Engineering, Korea Advanced Institute of Science and Technology在 kaist.ac.kr 的电子邮件经过验证
- Jose Jaramillo-VillegasPurdue University, Universidad Tecnológica de Pereira在 utp.edu.co 的电子邮件经过验证
- Min Tengimec在 imec-int.com 的电子邮件经过验证
- Abdullah Al NomanFailure Analysis R&D Engineer at Intel Corporation在 intel.com 的电子邮件经过验证
- Victor YurlovPrincipal Engineer of Samsung Electromechanics (Optics, MEMS, ISP)在 samsung.com 的电子邮件经过验证
- Vladimir A. AksyukProject Leader, Physical Measurement Laboratory, NIST在 nist.gov 的电子邮件经过验证
- Thomas LeBrunGroup Leader for Photonics and Optomechanics, NIST在 nist.gov 的电子邮件经过验证
- Junyeob SongNational Institute of Standards and Technology & University of Delaware在 NIST.GOV 的电子邮件经过验证
- David LongNational Institute of Standards and Technology在 nist.gov 的电子邮件经过验证
- Nan Ei Yu (N. E. Yu)Gwngju Institute of Science and Technology (GIST)在 gist.ac.kr 的电子邮件经过验证