Follow
Shaohui Yong
Shaohui Yong
Missouri University S&T
Verified email at ieee.org
Title
Cited by
Cited by
Year
Modeling strategy for EMI filters
R He, Y Xu, S Walunj, S Yong, V Khilkevich, D Pommerenke, HL Aichele, ...
IEEE Transactions on Electromagnetic Compatibility 62 (4), 1572-1581, 2020
362020
Dielectric loss tangent extraction using modal measurements and 2-D cross-sectional analysis for multilayer PCBs
S Yong, V Khilkevich, Y Liu, H Gao, S Hinaga, S De, D Padilla, ...
IEEE Transactions on Electromagnetic Compatibility 62 (4), 1278-1292, 2020
332020
Mechanical magnetic field generator for communication in the ULF range
H Rezaei, V Khilkevich, S Yong, DS Stutts, D Pommerenke
IEEE Transactions on Antennas and Propagation 68 (3), 2332-2339, 2019
332019
Differential integrated crosstalk noise (ICN) reduction among multiple differential BGA and Via pairs by using design of experiments (DoE) method
B Chen, M Ouyang, S Yong, Y Wang, Y Bai, Y Zhou, J Fan
Electromagnetic Compatibility (EMC), 2017 IEEE International Symposium, 2017
30*2017
Differential crosstalk mitigation in the pin field area of serdes channel with trace routing guidance
B Chen, S Pan, J Wang, S Yong, M Ouyang, J Fan
IEEE Transactions on Electromagnetic Compatibility 61 (4), 1385-1394, 2019
292019
Comprehensive and practical way to look at far-end crosstalk for transmission lines with lossy conductor and dielectric
S Yong, V Khilkevich, XD Cai, C Sui, B Sen, J Fan
IEEE Transactions on Electromagnetic Compatibility 62 (2), 510-520, 2019
262019
Passive intermodulation source localization based on emission source microscopy
S Yong, S Yang, L Zhang, X Chen, DJ Pommerenke, V Khilkevich
IEEE Transactions on Electromagnetic Compatibility 62 (1), 266-271, 2019
242019
S-Parameter De-Embedding Error Estimation Based on the Statistical Circuit Models of Fixtures
Y Liu, S Yong, H Gao, S Hinaga, D Padilla, D Yanagawa, JL Drewniak, ...
IEEE Transactions on Electromagnetic Compatibility 62 (4), 1459-1467, 2020
212020
Dielectric dissipation factor (DF) extraction based on differential measurements and 2-D cross-sectional analysis
S Yong, Y Liu, H Gao, B Chen, S De, S Hinaga, D Yanagawa, J Drewniak, ...
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and …, 2018
212018
Automatic sparse ESM scan using Gaussian process regression
J Li, J Zhou, S Yong, Y Liu, V Khilkevich
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2020
192020
A practical de-embedding error analysis method based on statistical circuit models of fixtures
S Yong, Y Liu, H Gao, S Hinaga, S De, D Padilla, D Yanagawa, ...
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal …, 2019
172019
A comprehensive and practical way to look at crosstalk for transmission lines with mismatched terminals
S Yong, K Cai, B Sen, J Fan, V Khilkevich, C Sui
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and …, 2018
172018
A cross-sectional profile based model for stripline conductor surface roughness
S Yong, V Khilkevich, Y Liu, R He, Y Guo, H Gao, S Hinaga, D Padilla, ...
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2020
132020
Limitations of first-order surface impedance boundary condition and its effect on 2D simulations for PCB transmission lines
Y Guo, DH Kim, J He, S Yong, Y Liu, X Ye, J Fan
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2020
122020
An empirical modeling of far-end crosstalk and insertion loss in microstrip lines
Y Liu, S Yong, Y Guo, J He, C Li, X Ye, J Fan, V Khilkevich, DH Kim
IEEE Transactions on Signal and Power Integrity 1, 130-139, 2022
102022
Far-end crosstalk control strategy for high-volume high-speed PCB manufacturing: The concept of critical resin content percent
Y Guo, S Yong, Y Liu, J He, B Pu, X Ye, A Sutono, V Kunda, A Luoh, ...
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 820-824, 2021
102021
Prepreg and Core Dielectric Permittivity (ϵr) Extraction for Fabricated Striplines’ Far-End Crosstalk Modeling
S Yong, S Penugonda, DH Kim, V Khilkevich, B Pu, X Ye, Q Gao, XD Cai, ...
IEEE Transactions on Electromagnetic Compatibility 64 (1), 209-218, 2021
92021
Dielectric Material and Foil Surface Roughness Properties Extraction Based on Single-ended Measurements and Phase Constant () Fitting
S Yong, V Khilkevich, S Penugonda, XD Cai, Q Gao, B Sen, H Gao, ...
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2020
92020
The simulated TDR impedance in PCB material characterization
Y Guo, DH Kim, J He, S Yong, Y Liu, B Pu, X Ye, J Fan
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 831-834, 2021
82021
Far-end crosstalk analysis for stripline with inhomogeneous dielectric layers (IDL)
Y Liu, S Yong, Y Guo, J He, L Liu, N Kutheis, A Sutono, V Kunda, A Luoh, ...
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 825-830, 2021
82021
The system can't perform the operation now. Try again later.
Articles 1–20