Virtex-4 VQ static SEU characterization summary G Allen, G Swift, C Carmichael Pasadena, CA: Jet Propulsion Laboratory, National Aeronautics and Space …, 2008 | 114 | 2008 |
Assessing and mitigating radiation effects in Xilinx SRAM FPGAs P Adell, G Allen, G Swift, S McClure 2008 European Conference on Radiation and Its Effects on Components and …, 2008 | 103 | 2008 |
Nanosatellites for earth environmental monitoring: The MicroMAS project W Blackwell, G Allen, C Galbraith, T Hancock, R Leslie, I Osaretin, ... 2012 12th Specialist Meeting on Microwave Radiometry and Remote Sensing of …, 2012 | 88 | 2012 |
Total dose effects in CMOS trench isolation regions AH Johnston, RT Swimm, GR Allen, TF Miyahira IEEE Transactions on Nuclear Science 56 (4), 1941-1949, 2009 | 61 | 2009 |
Single-event characterization of the 20 nm Xilinx Kintex UltraScale field-programmable gate array under heavy ion irradiation DS Lee, GR Allen, G Swift, M Cannon, M Wirthlin, JS George, R Koga, ... 2015 IEEE Radiation Effects Data Workshop (REDW), 1-6, 2015 | 59 | 2015 |
Comparison of single event transients generated at four pulsed-laser test facilities-NRL, IMS, EADS, JPL S Buchner, N Roche, J Warner, D McMorrow, F Miller, S Morand, ... IEEE Transactions on Nuclear Science 59 (4), 988-998, 2012 | 57 | 2012 |
MicroMAS: A first step towards a nanosatellite constellation for global storm observation W Blackwell, G Allen, C Galbraith, R Leslie, I Osaretin, M Scarito, ... | 48 | 2013 |
Static upset characteristics of the 90nm Virtex-4QV FPGAs GM Swift, GR Allen, CW Tseng, C Carmichael, G Miller, JS George 2008 IEEE Radiation Effects Data Workshop, 98-105, 2008 | 41 | 2008 |
Single-event upset (SEU) results of embedded error detect and correct enabled block random access memory (block RAM) within the xilinx XQR5VFX130 GR Allen, L Edmonds, CW Tseng, G Swift, C Carmichael IEEE Transactions on Nuclear Science 57 (6), 3426-3431, 2010 | 39 | 2010 |
Single event effects test results for advanced field programmable gate arrays GR Allen, GM Swift 2006 IEEE Radiation Effects Data Workshop, 115-120, 2006 | 36 | 2006 |
Compendium of XRTC radiation results on all single-event effects observed in the Virtex-5QV G Swift, C Carmichael, G Allen, G Madias, E Miller, R Monreal Proceedings of NASA military and aerospace programmable logic devices (MAPLD …, 2011 | 30 | 2011 |
2015 compendium of recent test results of single event effects conducted by the jet propulsion laboratory's radiation effects group GR Allen, LZ Scheick, F Irom, SM Guertin, PC Adell, M Amrbar, ... 2015 IEEE Radiation Effects Data Workshop (REDW), 1-14, 2015 | 28 | 2015 |
Single event latchup (SEL) and total ionizing dose (TID) of a 1 Mbit magnetoresistive random access memory (MRAM) J Heidecker, G Allen, D Sheldon 2010 IEEE Radiation Effects Data Workshop, 4-4, 2010 | 28 | 2010 |
Compendium of test results of single event effects conducted by the jet propulsion laboratory GR Allen 2008 IEEE Radiation Effects Data Workshop, 21-30, 2008 | 27 | 2008 |
Single event effect and total ionizing dose results of highly scaled flash memories F Irom, DN Nguyen, GR Allen 2013 IEEE Radiation Effects Data Workshop (REDW), 1-4, 2013 | 25 | 2013 |
Single-event transient testing of low dropout PNP series linear voltage regulators GR Allen, PC Adell, D Chen, P Musil IEEE Transactions on Nuclear Science 59 (6), 2764-2771, 2012 | 20 | 2012 |
The design and use of special purpose processors for the machine processing of remotely sensed data GR Allen, LO Bonrud, JJ Cosgrove, RM Stone | 20 | 1973 |
NSREC 2016 Special Issue of the IEEE TRANSACTIONS ON NUCLEAR SCIENCE S Abe, D Adams, P Adell, P Agopian, MA Aguirre, J Ahlbin, A Akkerman, ... IEEE Transactions on Nuclear Science 64 (1), 11, 2017 | 17 | 2017 |
Scaling effects in highly scaled commercial nonvolatile flash memories F Irom, DN Nguyen, GR Allen, SA Zajac 2012 IEEE Radiation Effects Data Workshop, 1-6, 2012 | 17 | 2012 |
Single event test methodologies and system error rate analysis for triple modular redundant field programmable gate arrays G Allen, LD Edmonds, G Swift, C Carmichael, CW Tseng, K Heldt, ... IEEE Transactions on Nuclear Science 58 (3), 1040-1046, 2011 | 17 | 2011 |