| Analytical estimation of threshold voltage variability by metal gate granularity in FinFET PH Vardhan, S Mittal, S Ganguly, U Ganguly IEEE Transactions on Electron Devices 64 (8), 3071-3076, 2017 | 31 | 2017 |
| An Analytical Model to Estimate FinFET’sDistribution Due to Fin-Edge Roughness S Mittal, AS Shekhawat, U Ganguly IEEE Transactions on Electron Devices 63 (3), 1352-1358, 2016 | 16 | 2016 |
| Impact of MOL/BEOL air-spacer on parasitic capacitance and circuit performance at 3 nm node A Pal, S Mittal, EM Bazizi, A Sachid, M Saremi, B Colombeau, G Thareja, ... 2019 International Conference on Simulation of Semiconductor Processes and …, 2019 | 14 | 2019 |
| Epitaxially defined FinFET: Variability resistant and high-performance technology S Mittal, S Gupta, A Nainani, MC Abraham, K Schuegraf, S Lodha, ... IEEE Transactions on Electron Devices 61 (8), 2711-2718, 2014 | 14 | 2014 |
| Statistical variability analysis of SRAM cell for emerging transistor technologies S Kurude, S Mittal, U Ganguly IEEE Transactions on Electron Devices 63 (9), 3514-3520, 2016 | 12 | 2016 |
| Analytical Model to Estimate FinFET’s , , SS, and Distribution Due to FER S Mittal, AS Shekhawat, S Ganguly, U Ganguly IEEE Transactions on Electron Devices 64 (8), 3489-3493, 2017 | 10 | 2017 |
| An Analytical Model to Estimate Distribution of Partially Correlated Fin Edges in FinFETs Due to Fin-Edge Roughness S Mittal, U Ganguly IEEE Transactions on Electron Devices 64 (4), 1708-1715, 2017 | 9 | 2017 |
| The First Compact Model to Determine Distribution for DG-FinFET Due to LER S Mittal, U Ganguly IEEE Transactions on Electron Devices 65 (11), 4772-4779, 2018 | 7 | 2018 |
| Analytical modeling of metal gate granularity based threshold voltage variability in NWFET PH Vardhan, S Mittal, S Ganguly, U Ganguly Solid-State Electronics 147, 26-34, 2018 | 7 | 2018 |
| FinFET scaling rule based on variability considerations S Mittal, AS Shekhawat, U Ganguly 2015 73rd Annual Device Research Conference (DRC), 127-128, 2015 | 6 | 2015 |
| A FinFET LER VTvariability estimation scheme with 300× efficiency improvement SN Chinta, S Mittal, P Debashis, U Ganguly 2014 International Conference on Simulation of Semiconductor Processes and …, 2014 | 6 | 2014 |
| Epi defined (ED) FinFET: An alternate device architecture for high mobility Ge channel integration in PMOSFET S Mittal, S Gupta, A Nainani, MC Abraham, K Schuegraf, S Lodha, ... 2013 IEEE 5th International Nanoelectronics Conference (INEC), 367-370, 2013 | 5 | 2013 |
| Epitaxialy defined (ED) FinFET: to reduce VTvariability and enable multiple VT S Mittal, S Gupta, A Nainani, MC Abraham, K Schuegraf, S Lodha, ... 70th Device Research Conference, 127-128, 2012 | 4 | 2012 |
| Analytical modeling of metal gate granularity induced Vt variability in NWFETs PH Vardhan, S Mittal, AS Shekhawat, S Ganguly, U Ganguly 2016 74th Annual Device Research Conference (DRC), 1-2, 2016 | 3 | 2016 |
| A bulk planar SiGe quantum-well based ZRAM with low Vt variability S Dutta, S Mittal, S Lodha, J Schulze, U Ganguly 2015 IEEE International Memory Workshop (IMW), 1-4, 2015 | 3 | 2015 |
| Epitaxial rare earth oxide (EOx) FinFET: A variability-resistant Ge FinFET architecture with multi VT S Mittal, S Kurude, S Dutta, P Debashis, S Ganguly, S Lodha, A Laha, ... 72nd Device Research Conference, 97-98, 2014 | 3 | 2014 |
| Highly-Doped Through-Contact Silicon Epi Design at 3 nm node S Mittal, A Pal, M Saremi, J Ferrell, M Haverty, T Miyashita, N Kim, ... 2019 Device Research Conference (DRC), 55-56, 2019 | 2 | 2019 |
| Selective fin trimming after dummy gate removal as the local fin width scaling approach for N5 and beyond T Miyashita, S Sun, S Mittal, MS Kim, A Pal, A Sachid, K Pathak, ... 2018 IEEE International Electron Devices Meeting (IEDM), 35.6. 1-35.6. 4, 2018 | 2 | 2018 |
| Fully self-aligned via R Freed, M Sachan, SS Roy, G Alva, HYD Hwang, U Mitra, EM Bazizi, ... US Patent 11,437,274, 2022 | 1 | 2022 |
| Via size optimization for optimum circuit performance at 3 nm node S Mittal, A Pal, M Saremi, EM Bazizi, B Alexander, B Ayyagari 2020 International Conference on Simulation of Semiconductor Processes and …, 2020 | 1 | 2020 |
Udayan GangulyProfessor, Electrical Engineering, IIT BombayVerified email at ee.iitb.ac.in
