Follow
Hussam Amrouch
Title
Cited by
Cited by
Year
Reliability-aware design to suppress aging
H Amrouch, B Khaleghi, A Gerstlauer, J Henkel
Proceedings of the 53rd Annual Design Automation Conference, 1-6, 2016
1082016
Towards interdependencies of aging mechanisms
H Amrouch, VM van Santen, T Ebi, V Wenzel, J Henkel
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 478-485, 2014
962014
Improving mobile gaming performance through cooperative CPU-GPU thermal management
A Prakash, H Amrouch, M Shafique, T Mitra, J Henkel
Proceedings of the 53rd annual design automation conference, 1-6, 2016
882016
Negative capacitance transistor to address the fundamental limitations in technology scaling: Processor performance
H Amrouch, G Pahwa, AD Gaidhane, J Henkel, YS Chauhan
IEEE Access 6, 52754-52765, 2018
782018
Weight-oriented approximation for energy-efficient neural network inference accelerators
ZG Tasoulas, G Zervakis, I Anagnostopoulos, H Amrouch, J Henkel
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (12), 4670-4683, 2020
732020
Ultra-low power and dependability for IoT devices (Invited paper for IoT technologies)
J Henkel, S Pagani, H Amrouch, L Bauer, F Samie
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017
702017
MLCAD: A survey of research in machine learning for CAD keynote paper
M Rapp, H Amrouch, Y Lin, B Yu, DZ Pan, M Wolf, J Henkel
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2021
572021
Impact of variability on processor performance in negative capacitance finfet technology
H Amrouch, G Pahwa, AD Gaidhane, CK Dabhi, F Klemme, O Prakash, ...
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (9), 3127-3137, 2020
552020
A simulation study of nbti impact on 14-nm node finfet technology for logic applications: Device degradation to circuit-level interaction
S Mishra, H Amrouch, J Joe, CK Dabhi, K Thakor, YS Chauhan, J Henkel, ...
IEEE Transactions on Electron Devices 66 (1), 271-278, 2018
522018
Recent advances in EM and BTI induced reliability modeling, analysis and optimization
SXD Tan, H Amrouch, T Kim, Z Sun, C Cook, J Henkel
Integration 60, 132-152, 2018
512018
Impact of extrinsic variation sources on the device-to-device variation in ferroelectric FET
K Ni, A Gupta, O Prakash, S Thomann, XS Hu, H Amrouch
2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020
492020
Reliability in super-and near-threshold computing: A unified model of RTN, BTI, and PV
VM Van Santen, J Martin-Martinez, H Amrouch, MM Nafria, J Henkel
IEEE Transactions on Circuits and Systems I: Regular Papers 65 (1), 293-306, 2017
482017
Towards aging-induced approximations
H Amrouch, B Khaleghi, A Gerstlauer, J Henkel
Proceedings of the 54th Annual Design Automation Conference 2017, 1-6, 2017
482017
Design automation of approximate circuits with runtime reconfigurable accuracy
G Zervakis, H Amrouch, J Henkel
IEEE access 8, 53522-53538, 2020
452020
Impact of BTI on dynamic and static power: From the physical to circuit level
H Amrouch, S Mishra, V van Santen, S Mahapatra, J Henkel
2017 IEEE International Reliability Physics Symposium (IRPS), CR-3.1-CR-3.6, 2017
422017
Aging-aware voltage scaling
VM Van Santen, H Amrouch, N Parihar, S Mahapatra, J Henkel
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 576-581, 2016
412016
Npu thermal management
H Amrouch, G Zervakis, S Salamin, H Kattan, I Anagnostopoulos, ...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020
402020
Stress balancing to mitigate NBTI effects in register files
H Amrouch, T Ebi, J Henkel
2013 43rd Annual IEEE/IFIP international conference on Dependable Systems …, 2013
382013
Approximate computing for ML: State-of-the-art, challenges and visions
G Zervakis, H Saadat, H Amrouch, A Gerstlauer, S Parameswaran, ...
Proceedings of the 26th Asia and South Pacific Design Automation Conference …, 2021
362021
Temperature dependence and temperature-aware sensing in ferroelectric FET
A Gupta, K Ni, O Prakash, XS Hu, H Amrouch
2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020
362020
The system can't perform the operation now. Try again later.
Articles 1–20