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Rostislav Váňa
Rostislav Váňa
TESCAN Brno s.r.o.
Verified email at tescan.com
Title
Cited by
Cited by
Year
Thermus and the Pink Discoloration Defect in Cheese
L Quigley, DJ O’Sullivan, D Daly, O O’Sullivan, Z Burdikova, R Vana, ...
MSystems 1 (3), 10.1128/msystems. 00023-16, 2016
692016
Surface passivation improves the synthesis of highly stable and specific DNA-functionalized gold nanoparticles with variable DNA density
J Deka, R Mech, L Ianeselli, H Amenitsch, F Cacho-Nerin, P Parisse, ...
ACS applied materials & interfaces 7 (12), 7033-7040, 2015
412015
Daylight induced antibacterial activity of gadolinium oxide, samarium oxide and erbium oxide nanoparticles and their aquatic toxicity
K Dědková, Ľ Kuzníková, L Pavelek, K Matějová, J Kupková, ...
Materials Chemistry and Physics 197, 226-235, 2017
332017
ZnO/graphite composites and its antibacterial activity at different conditions
K Dědková, B Janíková, K Matějová, K Čabanová, R Váňa, A Kalup, ...
Journal of Photochemistry and Photobiology B: Biology 151, 256-263, 2015
262015
Thermus and the pink discoloration defect in cheese. mSystems 1: e00023-16
L Quigley, DJ O’Sullivan, D Daly, O O’Sullivan, Z Burdikova, R Vana, ...
192016
Synthesis and characterization of gadolinium oxide nanocrystallites
L Kuzníková, K Dědková, L Pavelek, J Kupková, R Váňa, MH Rümmeli, ...
Proceedings of the 2nd Czech-China Scientific Conference 2016, 2017
82017
The effect of a taper angle on micro-compression testing of Mo-BC coatings
L Zábranský, K Bernátová, J Dluhoš, R Váňa, P Souček, P Vašina, ...
Materials 13 (14), 3054, 2020
72020
Characterization of inner structure of limestone by X-ray computed sub-micron tomography
D Kalasová, K Dvořák, M Slobodník, D Všianský, T Zikmund, J Dluhoš, ...
Construction and Building Materials 174, 693-700, 2018
72018
Speeding up large-scale failure analysis of semiconductor devices by laser ablation
M Tuček, R Blando, R Váňa, L Hladík, JV Oboňa
2020 IEEE International Symposium on the Physical and Failure Analysis of …, 2020
32020
Synthesis and Characterization of Samarium Oxide Nanocrystallites
Ĺ Kuzníková, K Dědková, L Pavelek, J Kupková, R Váňa, J Kukutschová
Journal of Nanoscience and Nanotechnology 16 (8), 7829-7831, 2016
32016
Synthesis and characterization of erbium oxide nanocrystallites
K Dědková, L Pavelek, J Kupková, R Váňa, J Kukutschová
Journal of Nanoscience and Nanotechnology 19 (5), 2934-2937, 2019
22019
Laser Ablation for Throughput Increase in Large Volume Semiconductor Failure Analysis Tasks
M Tuček, M Búran, R Váňa, L Hladík, JV Oboňa
International Symposium for Testing and Failure Analysis 83348, 17-19, 2020
12020
Confocal Raman-in-SEM Imaging: a New Method for 3D Morphology of Asbestos like Fibers in a Mineral Matrix-Complementarity with SEM-FIB.
G Wille, D Lahondère, U Schmidt, J Duron, R Vana, J Silvent, X Bourrat
Microscopy and Microanalysis 24 (S1), 2012-2013, 2018
12018
Correlative SEM and Raman imaging of hot spots on SERS substrate
R Vana, M Kocman, J Jiruse
Microscopy and Microanalysis 21 (S3), 153-154, 2015
12015
Aplikace nanotechnologií pro detekci biomolekul
PBR MĚCH
Brno: Vysoké učení technické v Brně, Fakulta strojního inženýrství, 2014
12014
An Alternative Approach to Cryo-FIB Lift-out Using a Novel Cooled Nanomanipulator
S Záchej, D Pinkas, M Zánová, V Filimonenko, J Javůrek, R Váňa
Microscopy and Microanalysis 29 (Supplement_1), 1046-1047, 2023
2023
Automation of In-trench TEM Lamella Workflow Increasing Throughput for Lift-out
M Šikula, L Hladík, J Oboňa, R Váňa
Microscopy and Microanalysis 26 (S2), 1980-1981, 2020
2020
Cryo-FIB Workflow for Fabricating Thin Lamellae Using TESCAN S8000G
S Záchej, T Heuser, Z Hovádková, J Havránková, K Rosíková, R Váňa
Microscopy and Microanalysis 25 (S2), 1016-1017, 2019
2019
TESCAN Cryo FIB-SEM as a Flexible Tool for Advanced Sample Analysis
R Váňa, K Rosíková, J Javůrek, T Nováček, J Havránková, S Záchej
Microscopy and Microanalysis 25 (S2), 566-567, 2019
2019
In-depth Analysis of 10 nm Exynos Processor using Micro CT and FIB-SEM System
S Sharang, J Dluhos, D Kalasova, A Denisyuk, R Vana, T Zikmund, ...
2019 IEEE 26th International Symposium on Physical and Failure Analysis of …, 2019
2019
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