| Single-event latchup in a 7-nm bulk FinFET technology DR Ball, CB Sheets, L Xu, J Cao, SJ Wen, R Fung, C Cazzaniga, ... IEEE Transactions on Nuclear Science 68 (5), 830-834, 2021 | 15 | 2021 |
| Single-event upsets in a 7-nm bulk FinFET technology with analysis of threshold voltage dependence JV D’Amico, DR Ball, J Cao, L Xu, M Rathore, SJ Wen, R Fung, ... IEEE Transactions on Nuclear Science 68 (5), 823-829, 2021 | 13 | 2021 |
| Alpha particle soft-error rates for D-FF designs in 16-nm and 7-nm bulk FinFET technologies J Cao, L Xu, BL Bhuva, SJ Wen, R Wong, B Narasimham, LW Massengill 2019 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2019 | 9 | 2019 |
| Temperature dependence of single-event transient pulse widths for 7-nm bulk FinFET technology J Cao, L Xu, SJ Wen, R Fung, B Narasimham, LW Massengill, BL Bhuva 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 8 | 2020 |
| SE response of guard-gate FF in 16-and 7-nm bulk FinFET technologies J Cao, L Xu, BL Bhuva, R Fung, SJ Wen, C Cazzaniga, C Frost IEEE Transactions on Nuclear Science 67 (7), 1436-1442, 2020 | 8 | 2020 |
| Thermal neutron induced soft errors in 7-nm bulk FinFET node L Xu, J Cao, J Brockman, C Cazzaniga, C Frost, SJ Wen, R Fung, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2020 | 7 | 2020 |
| Whole-brain, gray, and white matter time-locked functional signal changes with simple tasks and model-free analysis KG Schilling, M Li, F Rheault, Y Gao, L Cai, Y Zhao, L Xu, Z Ding, ... Proceedings of the National Academy of Sciences 120 (42), e2219666120, 2023 | 5 | 2023 |
| Changes in white matter functional networks across late adulthood M Li, Y Gao, RD Lawless, L Xu, Y Zhao, KG Schilling, Z Ding, ... Frontiers in Aging Neuroscience 15, 2023 | 4 | 2023 |
| Combined functional and structural imaging of brain white matter reveals stage-dependent impairment in multiple system atrophy of cerebellar type H Lin, L Lin, L Xu, S Li, P Song, M Li npj Parkinson's Disease 8 (1), 105, 2022 | 4 | 2022 |
| Functional alterations in bipartite network of white and grey matters during aging Y Gao, Y Zhao, M Li, RD Lawless, KG Schilling, L Xu, AT Shafer, ... NeuroImage 278, 120277, 2023 | 3 | 2023 |
| Automatic preprocessing pipeline for white matter functional analyses of large-scale databases Y Gao, DR Lawless, M Li, Y Zhao, KG Schilling, L Xu, AT Shafer, ... Medical Imaging 2023: Image Processing 12464, 155-161, 2023 | 3 | 2023 |
| High-Current State triggered by Operating-Frequency Change L Xu, J Cao, SJ Wen, R Fung, J Markevitch, DR Ball, BL Bhuva 2020 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2020 | 3 | 2020 |
| Single-event upset responses of dual-and triple-well D flip-flop designs in 7-nm bulk FinFET technology L Xu, J Cao, BL Bhuva, I Chatterjee, SJ Wen, R Wong, LW Massengill 2019 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2019 | 1 | 2019 |
| Quantification of mediation effects of white matter functional characteristics on cognitive decline in aging M Li, KG Schilling, F Gao, L Xu, S Choi, Y Gao, Z Zu, AW Anderson, ... Cerebral Cortex 34 (3), bhae114, 2024 | | 2024 |
| Seasonal variations of functional connectivity of human brains L Xu, S Choi, Y Zhao, M Li, BP Rogers, A Anderson, JC Gore, Y Gao, ... Scientific Reports 13 (1), 16898, 2023 | | 2023 |
| Functional correlation tensors in brain white matter and the effects of normal aging L Xu, Y Gao, M Li, R Lawless, Y Zhao, K Schilling, B Rogers, A Anderson, ... | | 2023 |
| High-Current State Triggered in the Bulk FinFET Technology L Xu | | 2020 |
Muwei LiVanderbilt University Medical CenterVerified email at vumc.org
