| Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistors M Simicic, NR Ashif, G Hellings, SH Chen, M Nag, AJ Kronemeijer, ... Microelectronics Reliability 108, 113632, 2020 | 7 | 2020 |
| Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD Using TLP G Hellings, P Roussel, N Wang, R Boschke, SH Chen, M Simicic, ... 2019 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2019 | | 2019 |
