| Electron field emission of geometrically modulated monolayer semiconductors TH Yang, KC Chiu, YW Harn, HY Chen, RF Cai, JJ Shyue, SC Lo, JM Wu, ... Advanced Functional Materials 28 (7), 1706113, 2018 | 29 | 2018 |
| Ultra-high thermal stability and extremely low Dit on HfO2/p-GaAs (001) interface HW Wan, YH Lin, KY Lin, TW Chang, RF Cai, J Kwo, M Hong Microelectronic Engineering 178, 154-157, 2017 | 11 | 2017 |
| Development of clustering algorithm applied for the EELS analysis of advanced devices MT Chang, RF Cai, CC Chen, SC Lo Microscopy and Microanalysis 26 (S2), 2112-2114, 2020 | 5 | 2020 |
| Enhancement of effective dielectric constant using high-temperature mixed and sub-nano-laminated atomic layer deposited Y2O3/Al2O3 on GaAs (001) KY Lin, LB Young, CK Cheng, KH Chen, YH Lin, HW Wan, RF Cai, SC Lo, ... Microelectronic engineering 178, 271-274, 2017 | 4 | 2017 |
| Novel spectral unmixing approach for electron energy-loss spectroscopy RF Cai, MT Chang, SC Lo, CC Chen New Journal of Physics 22 (3), 033029, 2020 | 3 | 2020 |
| Epitaxy of High-Quality Single-Crystal Hexagonal Perovskite YAlO3 on GaAs(111)A Using Laminated Atomic Layer Deposition LB Young, CK Cheng, KY Lin, YH Lin, HW Wan, RF Cai, SC Lo, MY Li, ... Crystal Growth & Design 19 (4), 2030-2036, 2019 | 3 | 2019 |
| Single-crystal hexagonal perovskite YAlO3 epitaxially on GaAs (111) A and (001) using atomic layer deposition CK Cheng, LB Young, KY Lin, YH Lin, HW Wan, GJ Lu, MT Chang, ... Microelectronic Engineering 178, 125-127, 2017 | 2 | 2017 |
| Atomic layer deposited single-crystal hexagonal perovskite YAlO3 epitaxially on GaAs (111) A LB Young, CK Cheng, GJ Lu, KY Lin, YH Lin, HW Wan, MY Li, RF Cai, ... Journal of Vacuum Science & Technology A 35 (1), 2017 | 2 | 2017 |
| Monolayer Semiconductors: Electron Field Emission of Geometrically Modulated Monolayer Semiconductors (Adv. Funct. Mater. 7/2018) TH Yang, KC Chiu, YW Harn, HY Chen, RF Cai, JJ Shyue, SC Lo, JM Wu, ... Advanced Functional Materials 28 (7), 1870046, 2018 | 1 | 2018 |
| Optimization of STEM Moiré analysis for Two-Dimensional Strain Characterization MT Chang, RF Cai, SY Liu, SC Lo Microscopy and Microanalysis 27 (S1), 1530-1533, 2021 | | 2021 |
| Epitaxy from a Periodic Y–O Monolayer: Growth of Single-Crystal Hexagonal YAlO3 Perovskite M Hong, CK Cheng, YH Lin, LB Young, RF Cai, CH Hsu, CT Wu, J Kwo Nanomaterials 10 (8), 1515, 2020 | | 2020 |
| P-type metal oxide semiconductor material and transistor SH Chiou, C Tzu-Chi, WH Chao, HM Cheng, MT Chang, TH Huang, ... US Patent 9,401,433, 2016 | | 2016 |
| B22-P-02 Combination of EBSD and EDS Characterization of the Crack Initiation and Propagation on Stainless Steel Cladding RF Cai, CC Liu, MT Chang, MW Lai, SC Lo, TP Cheng Microscopy 64 (suppl_1), i103-i103, 2015 | | 2015 |
| B12-P-04 Fabrication of in-situ TEM Biasing and Heating Holder: New Opportunities of Battery Characterization MT Chang, SC Lo, MW Lai, CY Hsieh, RF Cai Journal of Electron Microscopy 64 (suppl_1), i87-i87, 2015 | | 2015 |
