| USER-SMILE: Ultrafast stimulus error removal and segmented model identification of linearity errors for ADC built-in self-test T Chen, X Jin, RL Geiger, D Chen IEEE Transactions on Circuits and Systems I: Regular Papers 65 (7), 2059-2069, 2017 | 38 | 2017 |
| Ramp voltage generator and method for testing an analog-to-digital converter X Jin, DA Garrity US Patent 9,319,033, 2016 | 14 | 2016 |
| An on-chip ADC BIST solution and the BIST enabled calibration scheme X Jin, T Chen, M Jain, AK Barman, D Kramer, D Garrity, R Geiger, D Chen 2017 IEEE International Test Conference (ITC), 1-10, 2017 | 12 | 2017 |
| Low-cost high-quality constant offset injection for SEIR-based ADC built-in-self-test X Jin, N Sun 2014 IEEE International Symposium on Circuits and Systems (ISCAS), 285-288, 2014 | 10 | 2014 |
| Dynamic comparator T Chen, X Jin, JP Schat US Patent 10,505,519, 2019 | 6 | 2019 |
| Low cost high accuracy stimulus generator for on-chip spectral testing K Bhatheja, S Chaganti, D Chen, XR Jin, CC Dao, J Ren, A Kumar, ... 2022 IEEE International Test Conference (ITC), 514-518, 2022 | 5 | 2022 |
| Fast Gate Leakage Current Monitor With Large Dynamic Range K Bhatheja, X Jin, M Strong, D Chen IEEE Transactions on Circuits and Systems II: Express Briefs 68 (5), 1690-1694, 2021 | 5 | 2021 |
| Method for testing analog-to-digital converter and system therefor T Chen, X Jin US Patent 9,473,164, 2016 | 3 | 2016 |
| Method for testing differential analog-to-digital converter and system therefor T Chen, DA Garrity, X Jin US Patent 9,438,262, 2016 | 3 | 2016 |
| Apparatuses involving calibration of input offset voltage and signal delay of circuits and methods thereof T Chen, X Jin, JP Schat US Patent 11,585,849, 2023 | 2 | 2023 |
| Self-test apparatuses having distributed self-test controller circuits and controller circuitry to control self-test execution based on self-test properties and method thereof X Jin, JP Schat, T Chen, L Ma US Patent 10,816,595, 2020 | 2 | 2020 |
| Analog-to-digital converter (ADC) testing X Jin, DA Garrity, M Lehmann, K Abhishek US Patent 11,489,535, 2022 | 1 | 2022 |
| Unsupervised Learning-based Early Anomaly Detection in AMS Circuits of Automotive SoCs A Arunachalam, A Kizhakkayil, S Kundu, A Raha, S Banerjee, R Jin, F Su, ... 2022 IEEE International Test Conference (ITC), 229-238, 2022 | 1 | 2022 |
| Bootstrapped switch K Bhatheja, CC Dao, X Jin US Patent 11,418,188, 2022 | 1 | 2022 |
| Analog-test-bus apparatuses involving calibration of comparator circuits and methods thereof JP Schat, X Jin, T Chen US Patent 10,866,277, 2020 | 1 | 2020 |
| Testing of on-chip analog-mixed signal circuits using on-chip memory K Abhishek, X Jin, M Lehmann US Patent 11,961,577, 2024 | | 2024 |
| Matching Critical Analog Circuit Components up to 3rd Order Gradients for All Possible Exact Matching Ratios M Sekyere, I Bruce, R Yang, D Chen, CC Mcandrew, X Jin, C He, ... Authorea Preprints, 2024 | | 2024 |
| Layered architecture for managing health of an electronic system and methods for layered health management X Jin, AB Gonzalez, M Blazy-Winning US Patent App. 18/348,403, 2024 | | 2024 |
| Compensated alternating polarity capacitive structures RS Jones III, X Jin US Patent 11,728,336, 2023 | | 2023 |
| Innovation Practices Track: Silicon Lifecycle Management Challenges and Opportunities F Su, XR Jin, N Mukherjee, Y Zorian 2023 IEEE 41st VLSI Test Symposium (VTS), 1-1, 2023 | | 2023 |
Tao ChenMediaTekVerified email at mediatek.com
