Paolo Rech
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Understanding GPU errors on large-scale HPC systems and the implications for system design and operation
D Tiwari, S Gupta, J Rogers, D Maxwell, P Rech, S Vazhkudai, D Oliveira, ...
2015 IEEE 21st International Symposium on High Performance Computer …, 2015
Analyzing and increasing the reliability of convolutional neural networks on GPUs
FF dos Santos, PF Pimenta, C Lunardi, L Draghetti, L Carro, D Kaeli, ...
IEEE Transactions on Reliability 68 (2), 663-677, 2018
Using benchmarks for radiation testing of microprocessors and FPGAs
H Quinn, WH Robinson, P Rech, M Aguirre, A Barnard, M Desogus, ...
IEEE Transactions on Nuclear Science 62 (6), 2547-2554, 2015
A new hardware/software platform and a new 1/E neutron source for soft error studies: Testing FPGAs at the ISIS facility
M Violante, L Sterpone, A Manuzzato, S Gerardin, P Rech, M Bagatin, ...
IEEE Transactions on Nuclear Science 54 (4), 1184-1189, 2007
Evaluation and mitigation of radiation-induced soft errors in graphics processing units
DAGG de Oliveira, LL Pilla, T Santini, P Rech
IEEE Transactions on Computers 65 (3), 791-804, 2015
Impact of GPUs parallelism management on safety-critical and HPC applications reliability
P Rech, LL Pilla, POA Navaux, L Carro
2014 44th Annual IEEE/IFIP International Conference on Dependable Systems …, 2014
Selective hardening for neural networks in FPGAs
F Libano, B Wilson, J Anderson, MJ Wirthlin, C Cazzaniga, C Frost, ...
IEEE Transactions on Nuclear Science 66 (1), 216-222, 2018
GPGPUs: How to Combine High Computational Power with High Reliability
LB Gomez, F Cappello, L Carro, N DeBardeleben, B Fang, S Gurumurthi, ...
hgpu. org, 2014
An efficient and experimentally tuned software-based hardening strategy for matrix multiplication on GPUs
P Rech, C Aguiar, C Frost, L Carro
IEEE Transactions on Nuclear Science 60 (4), 2797-2804, 2013
Evaluation and mitigation of soft-errors in neural network-based object detection in three GPU architectures
FF dos Santos, L Draghetti, L Weigel, L Carro, P Navaux, P Rech
2017 47th Annual IEEE/IFIP International Conference on Dependable Systems …, 2017
Demystifying soft error assessment strategies on arm cpus: Microarchitectural fault injection vs. neutron beam experiments
A Chatzidimitriou, P Bodmann, G Papadimitriou, D Gizopoulos, P Rech
2019 49th Annual IEEE/IFIP International Conference on Dependable Systems …, 2019
Experimental and analytical study of xeon phi reliability
D Oliveira, L Pilla, N DeBardeleben, S Blanchard, H Quinn, I Koren, ...
Proceedings of the International Conference for High Performance Computing …, 2017
FPGAs and parallel architectures for aerospace applications
F Kastensmidt, P Rech
Soft Errors and Fault-Tolerant Design, 2016
Soft errors in DNN accelerators: A comprehensive review
Y Ibrahim, H Wang, J Liu, J Wei, L Chen, P Rech, K Adam, G Guo
Microelectronics Reliability 115, 113969, 2020
Neutron-induced failure in silicon IGBTs, silicon super-junction and SiC MOSFETs
A Griffoni, J van Duivenbode, D Linten, E Simoen, P Rech, L Dilillo, ...
IEEE Transactions on Nuclear Science 59 (4), 866-871, 2012
Analyzing the impact of radiation-induced failures in programmable SoCs
LA Tambara, P Rech, E Chielle, J Tonfat, FL Kastensmidt
IEEE Transactions on Nuclear Science 63 (4), 2217-2224, 2016
Modern GPUs radiation sensitivity evaluation and mitigation through duplication with comparison
DAG Oliveira, P Rech, HM Quinn, TD Fairbanks, L Monroe, SE Michalak, ...
IEEE Transactions on Nuclear Science 61 (6), 3115-3122, 2014
Analyzing the effectiveness of a frame-level redundancy scrubbing technique for SRAM-based FPGAs
J Tonfat, FL Kastensmidt, P Rech, R Reis, HM Quinn
IEEE transactions on nuclear science 62 (6), 3080-3087, 2015
Software-based hardening strategies for neutron sensitive FFT algorithms on GPUs
LL Pilla, P Rech, F Silvestri, C Frost, POA Navaux, MS Reorda, L Carro
IEEE Transactions on Nuclear Science 61 (4), 1874-1880, 2014
Register file criticality and compiler optimization effects on embedded microprocessor reliability
FM Lins, LA Tambara, FL Kastensmidt, P Rech
IEEE Transactions on Nuclear Science 64 (8), 2179-2187, 2017
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