| Microscopic hot-carrier degradation modeling of SiGe HBTs under stress conditions close to the SOA limit H Kamrani, D Jabs, V d’Alessandro, N Rinaldi, T Jacquet, C Maneux, ... IEEE Transactions on Electron Devices 64 (3), 923-929, 2017 | 28 | 2017 |
| Hot-carrier degradation in SiGe HBTs: A physical and versatile aging compact model C Mukherjee, T Jacquet, GG Fischer, T Zimmer, C Maneux IEEE Transactions on Electron Devices 64 (12), 4861-4867, 2017 | 27 | 2017 |
| Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit T Jacquet, G Sasso, A Chakravorty, N Rinaldi, K Aufinger, T Zimmer, ... Microelectronics Reliability 55 (9-10), 1433-1437, 2015 | 22 | 2015 |
| Low-frequency noise in advanced SiGe: C HBTs—Part I: Analysis C Mukherjee, T Jacquet, A Chakravorty, T Zimmer, J Böck, K Aufinger, ... IEEE Transactions on Electron Devices 63 (9), 3649-3656, 2016 | 18 | 2016 |
| Low-frequency noise in advanced SiGe: C HBTs—Part II: Correlation and modeling C Mukherjee, T Jacquet, A Chakravorty, T Zimmer, J Böck, K Aufinger, ... IEEE Transactions on Electron Devices 63 (9), 3657-3662, 2016 | 11 | 2016 |
| Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit C Mukherjee, T Jacquet, A Chakravorty, T Zimmer, J Boeck, K Aufinger, ... Microelectronics Reliability 73, 146-152, 2017 | 7 | 2017 |
| Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations C Mukherjee, T Jacquet, T Zimmer, C Maneux, A Chakravorty, J Boeck, ... 2016 46th European Solid-State Device Research Conference (ESSDERC), 260-263, 2016 | 7 | 2016 |
| Reliability of SiGe, C HBTs operating at 500 GHz: characterization and modeling T Jacquet Université de Bordeaux; Università degli studi di Napoli Federico II. Di. Pi. ST, 2016 | 2 | 2016 |
| MBSA Approaches Applied to Next Decade Digital System-On-a-Chip Components T Fiorucci, T Jacquet, JM Daveau, G Di Natale, E Arbaretier, P Roche Congrès Lambda Mu 23 «Innovations et maîtrise des risques pour un avenir …, 2022 | | 2022 |
| Evaluation de la disponibilité d'une constellation de satellites avec une approche Model-Based Safety Assessment T Jacquet, X De Bossoreille, M Maitre, V Casanovas, B Christophe Congrès Lambda Mu 23 «Innovations et maîtrise des risques pour un avenir …, 2022 | | 2022 |
| MBSA Approaches Applied to Next Decade Digital Components T Fiorucci, JM Daveau, E Arbaretier, G Di Natale, P Roche, T Jacquet IEEE European Test Symposium (ETS 2022), 2022 | | 2022 |
