Taizhi Liu
标题
引用次数
引用次数
年份
System-level modeling of microprocessor reliability degradation due to BTI and HCI
CC Chen, S Cha, T Liu, L Milor
2014 IEEE International Reliability Physics Symposium, CA. 8.1-CA. 8.9, 2014
292014
SRAM stability analysis for different cache configurations due to bias temperature instability and hot carrier injection
T Liu, CC Chen, J Wu, L Milor
2016 IEEE 34th International Conference on Computer Design (ICCD), 225-232, 2016
262016
System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown
T Liu, CC Chen, S Cha, L Milor
Microelectronics Reliability 55 (9-10), 1334-1340, 2015
212015
Comprehensive reliability-aware statistical timing analysis using a unified gate-delay model for microprocessors
T Liu, CC Chen, L Milor
IEEE Transactions on Emerging Topics in Computing 6 (2), 219-232, 2016
192016
System-level modeling of microprocessor reliability degradation due to bias temperature instability and hot carrier injection
CC Chen, T Liu, L Milor
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (8 …, 2016
172016
Extraction of threshold voltage degradation modeling due to negative bias temperature instability in circuits with I/O measurements
S Cha, CC Chen, T Liu, LS Milor
2014 IEEE 32nd VLSI Test Symposium (VTS), 1-6, 2014
172014
Comprehensive reliability and aging analysis on SRAMs within microprocessor systems
T Liu, CC Chen, W Kim, L Milor
Microelectronics Reliability 55 (9-10), 1290-1296, 2015
162015
Accurate standard cell characterization and statistical timing analysis using multivariate adaptive regression splines
T Liu, CC Chen, L Milor
Sixteenth International Symposium on Quality Electronic Design, 272-279, 2015
132015
Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits
K Yang, T Liu, R Zhang, DH Kim, L Milor
Microelectronics Reliability 76, 81-86, 2017
92017
Processor-level reliability simulator for time-dependent gate dielectric breakdown
CC Chen, T Liu, S Cha, L Milor
Microprocessors and Microsystems 39 (8), 950-960, 2015
92015
A comprehensive time-dependent dielectric breakdown lifetime simulator for both traditional CMOS and FinFET technology
K Yang, T Liu, R Zhang, L Milor
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (11 …, 2018
82018
A comparison study of time-dependent dielectric breakdown for analog and digital circuit's optimal accelerated test regions
K Yang, T Liu, R Zhang, L Milor
2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS), 1-6, 2017
82017
BM3D 视频去噪算法实现与评估
李政, 刘文江, 戎蒙恬, 刘太智
信息技术, 30-32, 2012
82012
Modeling of the reliability degradation of a FinFET-based SRAM due to bias temperature instability, hot carrier injection, and gate oxide breakdown
R Zhang, T Liu, K Yang, L Milor
2017 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2017
72017
Estimation of remaining life using embedded SRAM for wearout parameter extraction
W Kim, CC Chen, T Liu, S Cha, L Milor
2015 6th International Workshop on Advances in Sensors and Interfaces (IWASI …, 2015
72015
Implementation and evaluation of BM3D video denoising algorithms
Z Li, W Liu, M Rong, T Liu
Information Technology 4, 30-32, 2012
72012
Modeling for SRAM reliability degradation due to gate oxide breakdown with a compact current model
R Zhang, T Liu, K Yang, L Milor
2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS), 1-5, 2017
62017
A lifetime and power sensitive design optimization framework for a radio frequency circuit
K Yang, T Liu, R Zhang, L Milor
2017 IEEE International Integrated Reliability Workshop (IIRW), 1-4, 2017
62017
Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations
R Zhang, T Liu, K Yang, L Milor
Microelectronics Reliability 76, 87-91, 2017
62017
Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology
K Yang, T Liu, R Zhang, L Milor
2018 IEEE 36th VLSI Test Symposium (VTS), 1-6, 2018
52018
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