Electrical percolation thresholds of semiconducting single-walled carbon nanotube networks in field-effect transistors HK Jang, JE Jin, JH Choi, PS Kang, DH Kim, GT Kim Physical Chemistry Chemical Physics 17 (10), 6874-6880, 2015 | 26 | 2015 |
Catalytic etching of monolayer graphene at low temperature via carbon oxidation JE Jin, JH Lee, JH Choi, HK Jang, J Na, D Whang, DH Kim, GT Kim Physical Chemistry Chemical Physics 18 (1), 101-109, 2016 | 19 | 2016 |
Probing distinctive electron conduction in multilayer rhenium disulfide BC Lee, J Na, JH Choi, H Ji, GT Kim, MK Joo Advanced Materials 31 (6), 1805860, 2019 | 18 | 2019 |
Schottky nanocontact of one-dimensional semiconductor nanostructures probed by using conductive atomic force microscopy JA Lee, YR Lim, CS Jung, JH Choi, HS Im, K Park, J Park, GT Kim Nanotechnology 27 (42), 425711, 2016 | 18 | 2016 |
Transfer of transition-metal dichalcogenide circuits onto arbitrary substrates for flexible device applications H Lee, K Lee, Y Kim, H Ji, J Choi, M Kim, JP Ahn, GT Kim Nanoscale 11 (45), 22118-22124, 2019 | 12 | 2019 |
Real-time effect of electron beam on MoS2 field-effect transistors K Lee, H Lee, Y Kim, J Choi, JP Ahn, DH Shin, YH Cho, H Jang, SW Lee, ... Nanotechnology 31 (45), 455202, 2020 | 11 | 2020 |
Conductive carbon nanotube paper by recycling waste paper DH Kim, YI Cho, JH Choi, HS Kim, HC Shin, TS Lee, JW Jung, HD Kim, ... Rsc Advances 5 (41), 32118-32123, 2015 | 11 | 2015 |
Modeling and Understanding the Compact Performance of h‐BN Dual‐Gated ReS2 Transistor K Lee, J Choi, B Kaczer, A Grill, JW Lee, S Van Beek, E Bury, ... Advanced Functional Materials 31 (23), 2100625, 2021 | 10 | 2021 |
Influence of hydrogen incorporation on conductivity and work function of VO 2 nanowires JE Kim, JY Shin, HS Jang, JW Jeon, WG Hong, HJ Kim, J Choi, GT Kim, ... Nanoscale 11 (10), 4219-4225, 2019 | 10 | 2019 |
Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation K Lee, S Nam, H Ji, J Choi, JE Jin, Y Kim, J Na, MY Ryu, YH Cho, H Lee, ... npj 2D Materials and Applications 5 (1), 4, 2021 | 9 | 2021 |
Defect spectroscopy of sidewall interfaces in gate-all-around silicon nanosheet FET K Lee, Y Kim, H Lee, S Park, Y Lee, MK Joo, H Ji, J Lee, J Chun, M Sung, ... Nanotechnology 32 (16), 165202, 2021 | 7 | 2021 |
On/off ratio enhancement in single-walled carbon nanotube field-effect transistor by controlling network density via sonication HK Jang, JH Choi, DH Kim, GT Kim Applied Surface Science 444, 442-447, 2018 | 7 | 2018 |
Induction heating effect on the performance of flexible MoS2 field-effect transistors JM Shin, DH Kim, HK Jang, J Yun, J Na, GT Kim Applied Physics Letters 111 (15), 2017 | 7 | 2017 |
Ambipolar behavior in MoS2 field effect transistors by using catalytic oxidation JH Choi, HK Jang, JE Jin, JM Shin, DH Kim, GT Kim Appl. Phys. Lett. 109 (18), 183102, 2016 | 7 | 2016 |
Transformation and Evaporation of Surface Adsorbents on a Graphene “Hot Plate” JH Choi, DH Shin, H Inani, MH Kwon, K Mustonen, C Mangler, M Park, ... ACS applied materials & interfaces 12 (23), 26313-26319, 2020 | 4 | 2020 |
Soft-type trap-induced degradation of MoS2 field effect transistors YH Cho, MY Ryu, KJ Lee, SJ Park, JH Choi, BC Lee, W Kim, GT Kim Nanotechnology 29 (22), 22LT01, 2018 | 4 | 2018 |
Electrical percolation characteristics of metallic single-walled carbon nanotube networks by vacancy evolution DH Kim, JE Jin, M Piao, JH Choi, GT Kim Physical Chemistry Chemical Physics 16 (34), 18370-18374, 2014 | 4 | 2014 |
Surface modulation of graphene field effect transistors on periodic trench structure JE Jin, JH Choi, H Yun, HK Jang, BC Lee, A Choi, MK Joo, ... ACS Applied Materials & Interfaces 8 (28), 18513-18518, 2016 | 3 | 2016 |
Development trends of Solar cell technologies for Small satellite JH Choi Journal of the Korea Academia-Industrial cooperation Society 22 (5), 310-316, 2021 | 2 | 2021 |
Nanoscale Electrical Probes on a Single Facet of a ZnO Microwire: Device Fabrication and Local Electrical Characteristics Y Yun, DH Shin, H Kim, JH Choi, H Jeong, D Suh, H Kang, SW Lee ACS Applied Electronic Materials 4 (5), 2346-2352, 2022 | 1 | 2022 |