Effects of the oxide/interface traps on the electrical characteristics in Al/Yb2O3/SiO2/n-Si/Al MOS capacitors B Morkoç, A Kahraman, E Yılmaz Journal of Materials Science: Materials in Electronics 32 (7), 9231-9243, 2021 | 11 | 2021 |
Electrical parameters of the erbium oxide MOS capacitor for different frequencies B Morkoc, A Kahraman, A Aktag, E Yılmaz Celal Bayar University Journal of Science 15 (2), 139-143, 2019 | 9 | 2019 |
The relationship between structural and electrical properties of the post-deposition annealed Er2O3/n-Si hetero-structures A Kahraman, B Morkoc, E Yilmaz Materials Science in Semiconductor Processing 130, 105819, 2021 | 4 | 2021 |
Post-deposition annealing effect on the structural and electrical properties of ytterbium oxide as an alternative gate dielectric B Morkoc, A Kahraman, E Yilmaz Materials Chemistry and Physics 292, 126875, 2022 | 2 | 2022 |
Dose responses of the SiO2 used in radiation sensors in field effect transistor form A Kahraman, B Morkoc, O Yilmaz, E Yilmaz Journal of Bionic Memory 1 (1), 6-13, 2021 | 2 | 2021 |
The relationship between structural and electrical properties of the post-deposition annealed Er₂O₃/n-Si hetero-structures A Kahraman, B Morkoç, E Yılmaz Elsevier, 2021 | | 2021 |
Effects of the oxide/interface traps on the electrical characteristics in Al/Yb₂O₃/SiO₂/n-Si/Al MOS capacitors B Morkoç, A Kahraman, E Yılmaz Springer, 2021 | | 2021 |
Yb2O3/SiO2 yığın kapı oksit tabakasının MOS tabanlı radyasyon sensörlerinde duyar bölge olarak kullanılabilirliğinin araştırılması B Morkoç PQDT-Global, 2020 | | 2020 |
EVALUATION OF THE RadFET RADIATION SENSOR PERFORMANCE IN 18 MV-EXTERNAL BEAM B Morkoç, A Kahraman, D Yeğen, E Yılmaz Uludağ Üniversitesi Mühendislik Fakültesi Dergisi 24 (3), 309-318, 2019 | | 2019 |
IRRADIATION EFFECT ON Er2O3/n-Si STRUCTURE UNDER HIGH GAMMA-RAY DOSE A Kahraman, B Morkoc, A Mutale, U Gurer, E Yilmaz | | |