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Yu Hu (胡 瑜)
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Rt3d: Real-time 3-d vehicle detection in lidar point cloud for autonomous driving
Y Zeng, Y Hu, S Liu, J Ye, Y Han, X Li, N Sun
IEEE Robotics and Automation Letters 3 (4), 3434-3440, 2018
1702018
Exploring spatial-temporal multi-frequency analysis for high-fidelity and temporal-consistency video prediction
B Jin, Y Hu, Q Tang, J Niu, Z Shi, Y Han, X Li
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2020
1092020
See and think: Disentangling semantic scene completion
S Liu, Y Hu, Y Zeng, Q Tang, B Jin, Y Han, X Li
Advances in Neural Information Processing Systems 31, 2018
812018
IVF: Characterizing the vulnerability of microprocessor structures to intermittent faults
S Pan, Y Hu, X Li
IEEE transactions on very large scale integration (VLSI) systems 20 (5), 777-790, 2012
702012
iFill: an impact-oriented X-filling method for shift-and capture-power reduction in at-speed scan-based testing
J Li, Q Xu, Y Hu, X Li
Design, Automation & Test in Europe Conference & Exhibition (DATE), 1184-1189, 2008
662008
RPUF: Physical unclonable function with randomized challenge to resist modeling attack
J Ye, Y Hu, X Li
2016 IEEE Asian Hardware-Oriented Security and Trust (AsianHOST), 1-6, 2016
622016
On capture power-aware test data compression for scan-based testing
J Li, X Liu, Y Zhang, Y Hu, X Li, Q Xu
IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 67-72, 2008
452008
Towards human-like and transhuman perception in AI 2.0: a review
Y Tian, X Chen, H Xiong, H Li, L Dai, J Chen, J Xing, J Chen, X Wu, W Hu, ...
Frontiers of Information Technology & Electronic Engineering 18, 58-67, 2017
412017
Efficient attack on non-linear current mirror PUF with genetic algorithm
Q Guo, J Ye, Y Gong, Y Hu, X Li
2016 IEEE 25th Asian Test Symposium (ATS), 49-54, 2016
392016
SOC可测试性设计与测试技术
胡瑜, 韩银和, 李晓维
计算机研究与发展 42 (1), 153-162, 2005
372005
Hardware trojan in fpga cnn accelerator
J Ye, Y Hu, X Li
2018 IEEE 27th Asian Test Symposium (ATS), 68-73, 2018
362018
OPUF: Obfuscation logic based physical unclonable function
J Ye, Y Hu, X Li
2015 IEEE 21st International On-Line Testing Symposium (IOLTS), 156-161, 2015
352015
X-filling for simultaneous shift-and capture-power reduction in at-speed scan-based testing
J Li, Q Xu, Y Hu, X Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems (TVLSI) 18 …, 2010
342010
Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit
Y Han, Y Hu, X Li, H Li, A Chandra
IEEE Transactions on Very Large Scale Integration (VLSI) Systems (TVLSI) 15 …, 2007
322007
Modeling attacks on strong physical unclonable functions strengthened by random number and weak PUF
J Ye, Q Guo, Y Hu, H Li, X Li
2018 IEEE 36th VLSI Test Symposium (VTS), 1-6, 2018
312018
Partial-SET: Write Speedup of PCM Main Memory
Bing Li, Shuchang Shan, Yu Hu, Xiaowei Li
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014
312014
An on-chip test clock control scheme for multi-clock at-speed testing
XX Fan, Y Hu, LT Wang
IEEE Asian Test Symposium (ATS), 341-348, 2007
31*2007
Localized random access scan: towards low area and routing overhead
Y Hu, X Fu, X Fan, H Fujiwara
IEEE/ACM Asia and South Pacific Design Automation Conference (ASPDAC), 565-570, 2008
302008
Varnet: Exploring variations for unsupervised video prediction
B Jin, Y Hu, Y Zeng, Q Tang, S Liu, J Ye
2018 IEEE/RSJ International Conference on Intelligent Robots and Systems …, 2018
292018
Reliability-Oriented Placement and Routing Algorithm for SRAM-Based FPGAs
Keheng Huang, Yu Hu, Xiaowei Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems (TVLSI), 22 …, 2014
27*2014
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